| Record ID | marc_columbia/Columbia-extract-20221130-002.mrc:334574343:1344 |
| Source | marc_columbia |
| Download Link | /show-records/marc_columbia/Columbia-extract-20221130-002.mrc:334574343:1344?format=raw |
LEADER: 01344cam a2200361 a 4500
001 764514
005 20220526003706.0
008 890713t19891989enka b 001 0 eng
010 $a 88020730
020 $a0471917028 :$c$51.50
035 $a(OCoLC)18291264
035 $a(OCoLC)ocm18291264
035 $a(CStRLIN)NYCG89-B51020
035 $9ADV0417CU
035 $a(NNC)764514
035 $a764514
050 00 $aTK7871.15.G3$bL66 1989
082 0 $a621.3815/2$219
090 $aTK7871.15.G3$bL66 1989
100 1 $aLook, D. C.$q(David C.),$d1938-$0http://id.loc.gov/authorities/names/n87944942
245 10 $aElectrical characterization of GaAs materials and devices /$cDavid C. Look.
260 $aChichester ;$aNew York :$bWiley,$c[1989], ©1989.
300 $ax, 280 pages :$billustrations ;$c24 cmm.
336 $atext$2rdacontent
337 $aunmediated$2rdamedia
338 $avolume$2rdacarrier
490 1 $aDesign and measurement in electronic engineering
504 $aBibliography: p. 261-275.
500 $aIncludes index.
650 0 $aGallium arsenide semiconductors$xTesting.
650 0 $aMagnetoresistance.$0http://id.loc.gov/authorities/subjects/sh85079788
830 0 $aDesign and measurement in electronic engineering.$0http://id.loc.gov/authorities/names/n86703368
852 00 $boff,eng$hTK7871.15.G3$iL66 1989