| Record ID | marc_columbia/Columbia-extract-20221130-002.mrc:585152170:1068 |
| Source | marc_columbia |
| Download Link | /show-records/marc_columbia/Columbia-extract-20221130-002.mrc:585152170:1068?format=raw |
LEADER: 01068cam a22003017a 4500
001 960390
005 20220526045101.0
007 hd afa---baca
008 910502s1989 miu|||||ab |||| ||eng d
035 $a(OCoLC)507258129
035 $a(OCoLC)ocn507258129
035 $a(CStRLIN)NYCG91-B46276
035 $9AFF7824CU
035 $a(NNC)960390
035 $a960390
040 $aNNC$cNNC
100 1 $aCh'oe, Kwang-su.$0http://id.loc.gov/authorities/names/n2014072914
245 10 $aIn situ determination of thermal profiles during Czochralski silicon crystal growth by an eddy current technique /$cKwang Su Choe.
260 $c1989.
300 $avi, 140 leaves.
336 $atext$2rdacontent
337 $amicroform$2rdamedia
338 $amicrofilm reel$2rdacarrier
502 $aThesis (Ph. D.)--Columbia University, 1989.
504 $aIncludes bibliographical references.
533 $aMicrofilm.$bAnn Arbor, Mich. :$cUniversity Microfilms International,$d1989.$e1 microfilm reel ; 35 mm.
500 $a"89-19,143."
852 80 $boff,mrr$kMICROFLM$hFC89-$i19,143