| Record ID | marc_columbia/Columbia-extract-20221130-002.mrc:62954292:1263 |
| Source | marc_columbia |
| Download Link | /show-records/marc_columbia/Columbia-extract-20221130-002.mrc:62954292:1263?format=raw |
LEADER: 01263cam a2200349 a 4500
001 550927
005 20220525195503.0
008 870407s1986 xx a b 000 0 eng d
035 $a(OCoLC)506251823
035 $a(OCoLC)ocn506251823
035 $a(CStRLIN)NYCG87-B31063
035 $9ACK3597CU
035 $a(NNC)550927
035 $a550927
040 $aNNC$cNNC
090 $aLD1237.5D 1986$b.E82
100 1 $aEvans, Howard Lee.
245 10 $aMeasurement of Schottky barrier interface states /$cHoward Lee Evans.
260 $c1986.
300 $aviii, 219 leaves, bound :$billustrations ;$c29 cm
336 $atext$2rdacontent
337 $aunmediated$2rdamedia
338 $avolume$2rdacarrier
500 $aTypescript (photocopy).
502 $aThesis (Ph. D.)--Columbia University, 1986.
504 $aIncludes bibliographical references.
650 0 $aDiodes, Schottky-barrier.$0http://id.loc.gov/authorities/subjects/sh85038107
650 0 $aMetal insulator semiconductors.$0http://id.loc.gov/authorities/subjects/sh85084059
650 0 $aInterface circuits.$0http://id.loc.gov/authorities/subjects/sh85067249
650 0 $aSchottky barrier interface States.
852 00 $boff,eng$hLD1237.5D 1986$i.E82
852 00 $boff,dic$hLD1237.5D 1986$i.E82