| Record ID | marc_columbia/Columbia-extract-20221130-004.mrc:223547997:1824 |
| Source | marc_columbia |
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LEADER: 01824mam a2200337 a 4500
001 1676037
005 20220608211038.0
008 950718t19951995waua b 101 0 eng d
010 $a 95070064
020 $a0819417068 (pbk.)
035 $a(OCoLC)ocm32836722
035 $9AKU2807CU
035 $a1676037
040 $aAZU$cAZU
245 00 $aRefractometry :$b16-20 May 1994, Warsaw, Poland /$cMaksymilian Pluta, Mariusz Szyjer, chairs/editors ; organized by SPIE Poland Chapter, Institute of Applied Optics, Warsaw (Poland) ; sponsored by SPIE--the International Society for Optical Engineering, State Committee for Scientific Research (Poland).
260 $aBellingham, Wash., USA :$bSPIE,$c[1995], ©1995.
300 $axxii, 228 pages :$billustrations ;$c28 cm.
336 $atext$btxt$2rdacontent
337 $aunmediated$bn$2rdamedia
490 1 $aSPIE proceedings series ;$vv. 2208
504 $aIncludes bibliographical references and index.
650 0 $aRefraction$vCongresses.
650 0 $aRefraction, Double$vCongresses.
700 1 $aPluta, Maksymilian.$0http://id.loc.gov/authorities/names/n87855436
700 1 $aSzyjer, Mariusz.$0http://id.loc.gov/authorities/names/no93033791
710 2 $aSociety of Photo-optical Instrumentation Engineers.$bPoland Chapter.$0http://id.loc.gov/authorities/names/nr93050346
710 2 $aInstitute of Applied Optics (Poland)$0http://id.loc.gov/authorities/names/n96054377
710 2 $aSociety of Photo-optical Instrumentation Engineers.$0http://id.loc.gov/authorities/names/n78088934
710 2 $aKomitet Badań Naukowych (Poland)$0http://id.loc.gov/authorities/names/n93040767
830 0 $aProceedings of SPIE--the International Society for Optical Engineering ;$vv. 2208.$0http://id.loc.gov/authorities/names/n42030541
852 00 $boff,eng$hQC426$i.R44 1995g