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MARC Record from marc_columbia

Record ID marc_columbia/Columbia-extract-20221130-004.mrc:244432096:4563
Source marc_columbia
Download Link /show-records/marc_columbia/Columbia-extract-20221130-004.mrc:244432096:4563?format=raw

LEADER: 04563mam a2200409 a 4500
001 1690220
005 20220608212826.0
008 950928t19951995nyua b 100 0 eng d
010 $a 95076249
020 $a0780326342 (casebound)
020 $a0780326334 (softbound)
020 $a0780326350 (microfiche)
035 $a(OCoLC)ocm33217091
035 $9AKY7682CU
035 $a1690220
040 $aNSA$cNSA$dOrLoB
111 2 $aElectro$d(1995 :$cBoston, Mass.)
245 10 $aElectro/95 International :$bprofessional program proceedings, June 21-23, 1995, Hynes Convention Center, Boston, MA /$csponsored by IEEE Region 1, METSAC and CNEC, [and] ERA, New York and New England Chapters.
246 14 $aElectro '95
246 30 $aElectro /95
246 30 $aElectro 1995
260 $a[New York, N.Y.] :$bInstitute of Electrical and Electronics Engineers ;$aPiscataway, N.J. :$bAdditional copies available from IEEE Operations Center,$c[1995], ©1995.
300 $a485 pages :$billustrations ;$c28 cm
336 $atext$btxt$2rdacontent
337 $aunmediated$bn$2rdamedia
500 $a"IEEE catalog number: 95CH35790"--T.p. verso.
504 $aIncludes bibliographical references.
505 00 $tElectrical Imaging of Cardiac Activity /$rDana H. Brooks --$tNew IC Stacking Process Ideal for High-Density Memory Module and Hybrid Applications /$rChet Brown --$tThe Art of Doing Business in China /$rMichael S. Chester --$tThe Next Generation: CAD/CAM/CAE /$rHoward I. Cohen --$tEstimating Warranty and Service Costs from MTBF Estimates /$rJames P. Fahy --$tDesigning, Developing, and Prototyping Devices and Systems: The University Option /$rBill Goodhue and Mike Fiddy --$tEngineer Your Marketing Plan for Sales Success /$rJim Geisman --$tThe Future of Email or When will Grandma be on the Net? /$rPatricia Giencke --$tWho is Going to Buy the Darn Thing? /$rRalph E. Grabowski --$tThe Low Cost Alternative to UPS /$rEdward M. Gulachenski --$tEnvironmentally Appropriate Materials and Processes /$rElizabeth Harriman --$tSelecting the Right Cache Architecture for High Performance PCs /$rThomas Horton --$tCareer Advancement and Survival for Engineers /$rJohn Hoschette --
505 80 $tThe Application of Advanced Economic Analysis Techniques to the Evaluation of Network Expansion Alternatives /$rBrian D. Huntley --$tFrom Start to Finish: Protecting Ideas and Inventions with Intellectual Property /$rJoseph S. Iandiorio --$tHow Agile Manufacturing Can Improve Your Manufacturing Productivity and Quality /$rJohn Buford and Patrick Krolak --$tNovel Polymeric Materials for Electronic and Electro-Optic Applications /$rJayant Kumar --$tHow to Select an ISO 9000 Registrar /$rMartin Langer --$tDifferential GPS Markets in the 1990's /$rScott C. Lewis --$tUsing Multimedia and Virtual Reality in Engineering and Manufacturing /$rCarl Machover --$tDefining New Products /$rAlan Graham and Sheila Mello --$tAn Overview of the VSPA Semiconductor Package /$rMaria M. Portuondo --$tHow the University of Massachusetts Lowell Can Help /$rSharon Sambursky --$tDesigning-in Plastics, Polymers, and Novel Materials in Your Electronics Products /$rNick Schott --
505 80 $tAlgorithms for Network Reliability and Connection Availability Analysis /$rAndrew M. Shooman --$tRF Power Amplifiers - Classes A Through S /$rNathan O. Sokal --$tThe Next Generation: CAD/CAM/CAE /$rKenneth Spenser --$tReliability of Electronic Devices Containing Epoxy Resins /$rJ. C. Spitsbergen --$tUnderwater Acoustic Communications /$rMilica Stojanovic --$tInternet: A Computer Support Tool for Building the Human Genome /$rStanley E. Stolov --$tMaterial and Device Characterization to Improve Yield and Performance /$rChangmo Sung --$tGlobal Intelligent Networking: Architectures, Services and Design Principles /$rS. Y. Yeh --$tMultiplexing in Test Mode Reduces Pin Count Requirements /$rOded Yishay.
650 0 $aElectronics$vCongresses.$0http://id.loc.gov/authorities/subjects/sh2008102883
650 0 $aComputers$vCongresses.$0http://id.loc.gov/authorities/subjects/sh2008101310
650 0 $aTelecommunication$vCongresses.$0http://id.loc.gov/authorities/subjects/sh2008112721
650 0 $aLocal area networks (Computer networks)$vCongresses.$0http://id.loc.gov/authorities/subjects/sh2008107067
650 0 $aComputer network protocols$vCongresses.$0http://id.loc.gov/authorities/subjects/sh2008101491
710 2 $aInstitute of Electrical and Electronics Engineers.$bRegion 1.$0http://id.loc.gov/authorities/names/n88015651
852 00 $boff,eng$hTK7801$i.E42 1995g