| Record ID | marc_columbia/Columbia-extract-20221130-004.mrc:312092413:1499 |
| Source | marc_columbia |
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LEADER: 01499fam a2200337 a 4500
001 1737735
005 20220608223411.0
008 950504t19951995nyua b 001 0 eng
010 $a 95019428
020 $a0387945415 (hc : alk. paper)
035 $a(OCoLC)32547828
035 $a(OCoLC)ocm32547828
035 $9ALE6934CU
035 $a(NNC)1737735
035 $a1737735
040 $aDLC$cDLC$dDLC$dOrLoB-B
050 00 $aQC482.D5$bZ48 1995
082 00 $a545/.81$220
100 1 $aZevin, Lev S.$0http://id.loc.gov/authorities/names/n95044676
245 10 $aQuantitative X-ray diffractometry /$cLev S. Zevin, Giora Kimmel ; edited by Inez Mureinik.
260 $aNew York :$bSpringer,$c[1995], ©1995.
300 $axvii, 372 pages :$billustrations ;$c25 cm
336 $atext$btxt$2rdacontent
337 $aunmediated$bn$2rdamedia
504 $aIncludes bibliographical references (p. 355-364) and index.
505 00 $g1.$tIntroduction --$g2.$tPhysical basis --$g3.$tGeometric aspects of X-ray diffractometry --$g4.$tMethodology of quantitative phase analysis --$g5.$tPractical aspects of quantitative phase analysis --$g6.$tIndustrial applications.
650 0 $aX-rays$xDiffraction.$0http://id.loc.gov/authorities/subjects/sh85148750
650 0 $aX-rays$xDiffraction$xIndustrial applications.
700 1 $aKimmel, Giora.$0http://id.loc.gov/authorities/names/n95044680
700 1 $aMureinik, Inez.$0http://id.loc.gov/authorities/names/n95044694
852 00 $boff,eng$hQC482.D5$iZ48 1995