| Record ID | marc_columbia/Columbia-extract-20221130-004.mrc:52430198:1847 |
| Source | marc_columbia |
| Download Link | /show-records/marc_columbia/Columbia-extract-20221130-004.mrc:52430198:1847?format=raw |
LEADER: 01847fam a2200361 a 4500
001 1537503
005 20220608183504.0
008 940126s1994 nyua b 001 0 eng
010 $a 94003081
020 $a019509204X
035 $a(OCoLC)29877910
035 $a(OCoLC)ocm29877910
035 $9AKB6623CU
035 $a(NNC)1537503
035 $a1537503
040 $aDLC$cDLC$dNNC
050 00 $aQH212.S32$bS27 1994
082 00 $a502/.8/2$220
100 1 $aSarid, Dror.$0http://id.loc.gov/authorities/names/n90707655
245 10 $aScanning force microscopy :$bwith applications to electric, magnetic, and atomic forces /$cDror Sarid.
250 $aRev. ed.
260 $aNew York :$bOxford University Press,$c1994.
263 $a9405
300 $axiii, 263 pages :$billustrations ;$c25 cm.
336 $atext$btxt$2rdacontent
337 $aunmediated$bn$2rdamedia
490 1 $aOxford series in optical and imaging sciences ;$v5
504 $aIncludes bibliographical references (p. 233-259) and index.
505 0 $aCh. 1. Mechanical Properties of Levers -- Ch. 2. Resonance Enhancement -- Ch. 3. Sources of Noise -- Ch. 4. Tunneling Detection System -- Ch. 5. Capacitance Detection System -- Ch. 6. Homodyne Detection System -- Ch. 7. Heterodyne Detection System -- Ch. 8. Laser-Diode Feedback Detection System -- Ch. 9. Polarization Detection System -- Ch. 10. Deflection Detection System -- Ch. 11. Electric Force Microscopy -- Ch. 12. Magnetic Force Microscopy -- Ch. 13. Atomic Force Microscopy.
650 0 $aScanning force microscopy.$0http://id.loc.gov/authorities/subjects/sh92006473
650 0 $aSurfaces (Physics)$0http://id.loc.gov/authorities/subjects/sh85130749
830 0 $aOxford series in optical and imaging sciences ;$v5.$0http://id.loc.gov/authorities/names/n91058510
852 00 $boff,bio$hQH212.S32$iS27 1994