| Record ID | marc_columbia/Columbia-extract-20221130-004.mrc:52837456:1389 |
| Source | marc_columbia |
| Download Link | /show-records/marc_columbia/Columbia-extract-20221130-004.mrc:52837456:1389?format=raw |
LEADER: 01389mam a22003018a 4500
001 1537817
005 20220608183530.0
008 940602t19951995maua b 001 0 eng
010 $a 94021066
020 $a0890067260
035 $a(OCoLC)ocm30703157
035 $9AKB6992CU
035 $a1537817
040 $aDLC$cDLC$dFUG
050 00 $aTK7871.99.M44$bR35 1995
082 00 $a621.39/5/0287$220
100 1 $aRajsuman, Rochit.$0http://id.loc.gov/authorities/names/n89658334
245 10 $aIddq testing for CMOS VLSI /$cRochit Rajsuman.
260 $aBoston :$bArtech House,$c[1995], ©1995.
263 $a9409
300 $axii, 193 pages :$billustrations ;$c24 cm
336 $atext$btxt$2rdacontent
337 $aunmediated$bn$2rdamedia
504 $aIncludes bibliographical references and index.
505 0 $aCh. 1. Introduction: Physical Defects and Bridging Faults in CMOS ICs -- Ch. 2. Introduction to Current Testing -- Ch. 3. Test Generation for Iddq Testing -- Ch. 4. Use of Iddq Testing in IC Production Lines -- Ch. 5. Current-Sensing Techniques -- Ch. 6. Case Studies With Iddq Testing -- Ch. 7. Summary and Suggestions.
650 0 $aIddq testing.$0http://id.loc.gov/authorities/subjects/sh94004152
650 0 $aIntegrated circuits$xVery large scale integration$xTesting.$0http://id.loc.gov/authorities/subjects/sh2009127319
852 00 $boff,eng$hTK7871.99.M44$iR35 1995