MARC Record from marc_columbia

LEADER: 04192mam a2200349 a 4500
001 1983853
005 20220609043041.0
008 970512t19971997waua b 101 0 eng d
020 $a0819424404
035 $a(OCoLC)ocm36886324
035 $9AMK3190CU
035 $a1983853
040 $aLHL$cLHL$dCUS$dOrLoB-B
245 00 $aMachine vision applications in industrial inspection V :$b10-11 February, 1997, San Jose, California /$cA. Ravishankar Rao, Ning Chang, chairs/editors ; sponsored by IS&T--the Society for Imaging Science and Technology [and] SPIE--the International Society for Optical Engineering.
260 $aBellingham, Washington :$bSPIE,$c[1997], ©1997.
300 $av, 200 pages :$billustrations ;$c28 cm.
336 $atext$btxt$2rdacontent
337 $aunmediated$bn$2rdamedia
490 1 $aProceedings of SPIE ;$vv. 3029
504 $aIncludes bibliographical references and author index.
505 00 $tImage understanding algorithms for remote visual inspection of aircraft surfaces /$rP. Gunatilake, M. W. Siegel and A. J. Jordan [et al.] --$tFeature analysis and classification of manufacturing signatures based on semiconductor wafer maps /$rK. W. Tobin, S. S. Gleason and T. P. Karnowski [et al.] --$tAutomated pilling detection and fuzzy classification of textile fabrics /$rI. M. Dar, W. Mahmood and G. Vachtsevanos --$tObject recognition algorithm based on inexact graph matching and its application in a color vision system for recognition of electronic components on PCBs /$rN. H. Kroupnova and M. J. Korsten --$tBinocular peripheral vision system /$rT. Maniere, R. Benosman and C. Gastaud [et al.] --$tDark-field Scheimpflug imaging for surface inspection /$rC. Bakolias and A. K. Forrest --$tLighting study for an optimal defect detection by artificial vision /$rC. Coulot, S. Kohler-Hemmerlin and C. Dumont [et al.] --$tImage quality in automated visual web inspection /$rJ. Laitinen --
505 80 $tComplete robot-eye calibration without special calibration objects /$rJ. H. M. Byne and J. A. D. W. Anderson --$tDesign and implementation of a metal surface defect image acquisition system /$rJ. H. Han and K. Yi --$tReal-time holographic nondestructive inspection system with automatic defect classification /$rH. H. Chen, T. M. Aye and D. Kim [et al.] --$tSet of texture similarity measures /$rA. Carkacioglu and F. T. Yarman-Vural --$tAutomatic configuration of surface inspection systems /$rC. Kueblbeck and T. Wagner --$tGradient-based Hough transform for the detection and characterization of defects during nondestructive inspection /$rL. F. C. Lew Yan Voon, P. Bolland and O. Laligant [et al.] --$tNovel combinatorial probabilistic Hough transform technique for detection of underwater bubbles /$rJ. Y. Goulermas and P. Liatsis --$tDiffusion equation and its application to SMD inspection /$rB. Li, J. R. Villalobos and J. M. Gallegos [et al.] --
505 80 $tEfficient image-processing method in 3D vision inspection /$rH. Zhou, J. Chen and O. Daoshan [et al.] --$tHierarchical distributed template matching /$rM. Hirooka, K. Sumi and M. Hashimoto [et al.] --$tRobust-statistic-based template matching /$rB. Li, D. Zhao and J. R. Villalobos [et al.] --$tImage preprocessing to improve the reliability of normalized correlation /$rD. D. Bacon.
650 0 $aQuality control$xOptical methods$xAutomation$vCongresses.$0http://id.loc.gov/authorities/subjects/sh2008122814
650 0 $aComputer vision$vCongresses.$0http://id.loc.gov/authorities/subjects/sh2008101162
650 0 $aEngineering inspection$vCongresses.$0http://id.loc.gov/authorities/subjects/sh2008119500
700 1 $aRavishankar Rao, A.$0http://id.loc.gov/authorities/names/n90623862
700 1 $aZhang, Ning.$0http://id.loc.gov/authorities/names/n86072964
710 2 $aIS & T--the Society for Imaging Science and Technology.$0http://id.loc.gov/authorities/names/n91063246
710 2 $aSociety of Photo-optical Instrumentation Engineers.$0http://id.loc.gov/authorities/names/n78088934
830 0 $aProceedings of SPIE--the International Society for Optical Engineering ;$vv. 3029.$0http://id.loc.gov/authorities/names/n42030541
852 00 $boff,eng$hTS156.2$i.M32 1997g