| Record ID | marc_columbia/Columbia-extract-20221130-004.mrc:627555665:3254 |
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LEADER: 03254fam a2200373 a 4500
001 1988482
005 20220609043917.0
008 950728s1997 enka b 001 0 eng
010 $a 95037567
020 $a0521434564 (hc)
020 $a0521435919 (pb)
035 $a(OCoLC)32970105
035 $a(OCoLC)ocm32970105
035 $9AMK9570CU
035 $a(NNC)1988482
035 $a1988482
040 $aDLC$cDLC$dDLC$dOrLoB-B
050 00 $aQH212.E4$bW38 1997
082 00 $a502/.8/25$220
100 1 $aWatt, Ian M.,$d1926-$0http://id.loc.gov/authorities/names/n82271799
245 14 $aThe principles and practice of electron microscopy /$cIan M. Watt.
250 $a2nd ed.
260 $aCambridge ;$aNew York :$bCambridge University Press,$c1997.
300 $ax, 484 pages :$billustrations ;$c26 cm
336 $atext$btxt$2rdacontent
337 $aunmediated$bn$2rdamedia
504 $aIncludes bibliographical references (p. [448]-473) and indexes.
505 00 $g1.$tMicroscopy with light and electrons --$g2.$tElectron-specimen interactions: processes and detectors --$g3.$tThe electron microscope family --$g4.$tSpecimen preparation for electron microscopy --$g5.$tThe interpretation and analysis of micrographs --$g6.$tAnalysis in the electron microscope --$g7.$tSpecialised EM- and other microscopical and analytical techniques --$g8.$tExamples of the use of electron microscopy --$gApp. 1.$tProduction and measurement of high vacua --$gApp. 2.$tVacuum deposition of thin metallic and carbon films for electron microscopy --$gApp. 3.$tX-ray spectrometry --$gApp. 4.$tElectron sources for electron microscopes --$tNames and addresses of EM manufacturers and their agents.
520 $aAs with the first edition, the principal aim of the book is to present the subject of electron microscopy in a readable way, both to readers who may never see an electron microscope but who need to know what these instruments are and how they perform, and also to practising electron microscopists by providing an up-to-date picture of the changes taking place in fields other than their own.
520 8 $aCompared with the first edition, the number of chapters has been increased from 5 to 8 (with 4 Appendixes). One of the new chapters explains the interactions taking place between an electron beam and a sample, which results in signals that can be used for imaging and analysis. Another deals with microanalysis in electron microscopes, the invaluable added bonus of using electrons instead of light for microscopy.
520 8 $aThe third new chapter results from the logical separation of specimen preparation techniques and the interpretation of micrographs into separate chapters. Throughout the book the coverage has been brought completely up to date, whilst retaining techniques devised in the early days of electron microscopy which are still relevant and widely used.
520 8 $aThis guide to electron microscopy, written by an author with thirty years practical experience of the technique, will be invaluable to new and experienced users of electron microscopes in any area of science and technology.
650 0 $aElectron microscopy.$0http://id.loc.gov/authorities/subjects/sh85042221
852 00 $boff,bio$hQH212.E4$iW38 1997