| Record ID | marc_columbia/Columbia-extract-20221130-004.mrc:642721976:1838 |
| Source | marc_columbia |
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LEADER: 01838fam a2200337 a 4500
001 1999214
005 20220609045520.0
008 970130t19971997gw a b 001 0 eng
010 $a 97006983
020 $a3540625682 (Berlin : hardcover : acid-free paper)
035 $a(OCoLC)36343442
035 $a(OCoLC)ocm36343442
035 $9AMM2354CU
035 $a(NNC)1999214
035 $a1999214
040 $aDLC$cDLC$dDLC$dOrLoB-B
050 00 $aQH212.T7$bR43 1997
082 00 $a502/.8/25$221
100 1 $aReimer, Ludwig,$d1928-$0http://id.loc.gov/authorities/names/n83160359
245 10 $aTransmission electron microscopy :$bphysics of image formation and microanalysis /$cLudwig Reimer.
250 $a4th ed.
260 $aBerlin ;$aNew York :$bSpringer,$c[1997], ©1997.
300 $axvi, 584 pages :$billustrations ;$c24 cm.
336 $atext$btxt$2rdacontent
337 $aunmediated$bn$2rdamedia
490 1 $aSpringer series in optical sciences,$x0342-4111 ;$vv. 36
504 $aIncludes bibliographical references (p. [495]-569) and index.
505 00 $g1.$tIntroduction --$g2.$tParticle Optics of Electrons --$g3.$tWave Optics of Electrons --$g4.$tElements of a Transmission Electron Microscope --$g5.$tElectron-Specimen Interactions --$g6.$tScattering and Phase Contrast for Amorphous Specimens --$g7.$tTheory of Electron Diffraction --$g8.$tElectron Diffraction Modes and Applications --$g9.$tImaging of Crystalline Specimens and Their Defects --$g10.$tElemental Analysis by X-Ray and Electron Energy-Loss Spectroscopy --$g11.$tSpecimen Damage by Electron Irradiation.
650 0 $aTransmission electron microscopy.$0http://id.loc.gov/authorities/subjects/sh93001918
830 0 $aSpringer series in optical sciences ;$vv. 36.$0http://id.loc.gov/authorities/names/n42023186
852 00 $boff,eng$hQH212.T7$iR43 1997