| Record ID | marc_columbia/Columbia-extract-20221130-005.mrc:157159787:3763 |
| Source | marc_columbia |
| Download Link | /show-records/marc_columbia/Columbia-extract-20221130-005.mrc:157159787:3763?format=raw |
LEADER: 03763mam a2200337 a 4500
001 2118872
005 20220615205942.0
008 980311t19981998wau 101 0 eng d
020 $a0819427462
035 $a(OCoLC)ocm38585585
035 $9ANF6470CU
035 $a2118872
040 $aCUS$cCUS$dOrLoB-B
245 00 $aMachine vision applications in industrial inspection VI :$b27 January 1998, San Jose, California /$cA. Ravishankar Rao, Ning Chang, chairs/editors ; sponsored by IS&T--the Society for Imaging Science and Technology [and] SPIE--the International Society for Optical Engineering.
260 $aBellingham, Wash., USA :$bSPIE,$c[1998], ©1998.
300 $av, 158 pages :$billustrations ;$c28 cm.
336 $atext$btxt$2rdacontent
337 $aunmediated$bn$2rdamedia
490 1 $aSPIE proceedings series ;$vv. 3306
504 $aIncludes bibliographical references and index.
505 00 $tAutomatic blemish detection in liquid crystal flat panel displays /$rW. K. Pratt, S. S. Sawkar and K. O'Reilly --$tAutomated optical inspection technology for HDD head suspension /$rS. Sakai, H. Oka and M. Ando --$tMachine vision system applied to the characterization of a powder stream: application to the laser cladding process /$rF. Meriaudeau, F. Truchetet and D. Aluze [et al.] --$tComparison of several artificial neural network classifiers for CT images of hardwood logs /$rD. L. Schmoldt, J. He and A. L. Abbott --$tFuzzy logic connectivity in semiconductor defect clustering /$rT. P. Karnowski, S. S. Gleason and K. W. Tobin, Jr. --$tNew algorithm to calculate the center of laser reflections /$rD. Yang, J. Chen and H. Zhou [et al.] --$tDevelopment of high-speed 3D inspection system for solder bumps /$rY. Nishiyama, H. Tsukahara and Y. Oshima [et al.] --$tDetection of small or low-contrast defects in web inspection /$rJ. Laitinen --
505 80 $tAutomated detection of Karnal bunt teliospores /$rK. D. Linder, C. W. Baumgart and J. Creager [et al.] --$tRule-based inspection of printed green ceramic tape /$rD. R. Patek, J. S. Goddard and T. P. Karnowski [et al.] --$tShift-, rotation-, and scale-invariant shape recognition system using an optical Hough transform /$rV. Schmid, G. Bader and E. H. Lueder --$tHigh-speed optoelectric image processing unit for industrial inspection /$rG. Cheng, G. Jin and M. Wu [et al.] --$tAdaptation of the fuzzy k-nearest neighbor classifier for manufacturing automation /$rK. W. Tobin, Jr., S. S. Gleason and T. P. Karnowski --$tRepresenting the object model for automatic visual inspection using a description language /$rR. Sablatnig and C. Menard --$tOptoelectronic morphological processor for industrial online inspection /$rH. Liu, M. Wu and G. Jin [et al.] --$tMachine vision system for inner-wall surface inspection /$rB. H. Zhuang and W. W. Zhang.
650 0 $aEngineering inspection$xAutomation$vCongresses.$0http://id.loc.gov/authorities/subjects/sh2008119499
650 0 $aComputer vision$xIndustrial applications$vCongresses.$0http://id.loc.gov/authorities/subjects/sh2009121257
650 0 $aQuality control$xOptical methods$xAutomation$vCongresses.$0http://id.loc.gov/authorities/subjects/sh2008122814
700 1 $aRavishankar Rao, A.$0http://id.loc.gov/authorities/names/n90623862
700 1 $aChang, Ning-San.$0http://id.loc.gov/authorities/names/n81060922
710 2 $aIS & T--the Society for Imaging Science and Technology.$0http://id.loc.gov/authorities/names/n91063246
710 2 $aSociety of Photo-optical Instrumentation Engineers.$0http://id.loc.gov/authorities/names/n78088934
830 0 $aProceedings of SPIE--the International Society for Optical Engineering ;$vv. 3306.$0http://id.loc.gov/authorities/names/n42030541
852 00 $boff,eng$hTS156.2$i.M32 1998g