| Record ID | marc_columbia/Columbia-extract-20221130-005.mrc:479281218:1938 |
| Source | marc_columbia |
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LEADER: 01938mam a2200385 a 4500
001 2372166
005 20220616032435.0
008 991021t19991999njua b 101 0 eng d
010 $a 98088539
020 $a0780351878 (siftbound)
020 $a0780351886 (microfiche)
035 $a(OCoLC)ocm42675720
035 $9APQ6628CU
035 $a2372166
040 $aLHL$cLHL
090 $aTK7874$b.I687 1999
111 2 $aInternational Symposium on the Physical & Failure Analysis of Integrated Circuits$n(7th :$d1999 :$cSingapore)
245 10 $aProceedings of the 1999 7th International Symposium on the Physical & Failure Analysis of Integrated Circuits [IPFA '99 :$b5-9 July, 1999, Orchard Hotel, Singapore] /$cedited by Chim Wai Kin, M.K. Radhakrishnan, John Thong ; organised by, IEEE Reliability/CPMT/ED Singapore Chapter [and others].
246 31 $aPhysical & failure analysis of integrated circuites
246 31 $a7th International Symposium on the Physical & Failure Analysis of Integrated Circuits
246 31 $aIPFA '99
260 $aPiscataway, New Jersey :$bIEEE,$c[1999], ©1999.
300 $a[viii], 209 pages, 4 unnumbered pages :$billustrations ;$c30 cm
336 $atext$btxt$2rdacontent
337 $aunmediated$bn$2rdamedia
500 $a"IPFA '99 proceedings"--Cover.
500 $a"IEEE Catalog Number 99TH8394"--verso of T.p.
504 $aIncludes bibliographic references and author index.
650 0 $aIntegrated circuits$xDefects$vCongresses.
650 0 $aIntegrated circuits$xTesting$vCongresses.$0http://id.loc.gov/authorities/subjects/sh2008104739
700 1 $aChim, Wai Kin.$0http://id.loc.gov/authorities/names/n98042450
700 1 $aRadhakrishnan, M. K.$0http://id.loc.gov/authorities/names/n96061636
700 1 $aThong, John.
710 2 $aIEEE Singapore Section.$bReliability/CPMT/EDS Chapter.$0http://id.loc.gov/authorities/names/nr96019105
852 00 $boff,eng$hTK7874$i.I684 1999g