MARC Record from marc_columbia

LEADER: 02244fam a2200409 a 4500
001 2406713
005 20220616041152.0
008 981109t19981998waua b 101 0 eng d
010 $a 99159849
020 $a0819429821
035 $a(OCoLC)40261494
035 $a(OCoLC)ocm40261494
035 $9APU9421CU
035 $a(NNC)2406713
035 $a2406713
040 $aMoKL$cMoKL$dOCoLC$dDLC
042 $alccopycat
050 00 $aTA1634$b.M3355 1998
082 00 $a670.42/5$221
245 00 $aMachine vision systems for inspection and metrology VII :$b4-5 November, 1998, Boston, Massachusetts /$cBruce G. Batchelor, John W.V. Miller, Susan Snell Soloman, chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering ; endorsed by MVA/SME--Machine Vision Association of the Society of Manufacturing Engineers.
260 $aBellingham, Wash. :$bSPIE,$c[1998], ©1998.
300 $axi, 386 pages :$billustrations ;$c28 cm.
336 $atext$btxt$2rdacontent
337 $aunmediated$bn$2rdamedia
490 1 $aProceedings of SPIE,$x0277-786X ;$vv. 3521
504 $aIncludes bibliographical references and index.
650 0 $aComputer vision$vCongresses.$0http://id.loc.gov/authorities/subjects/sh2008101162
650 0 $aEngineering inspection$xAutomation$vCongresses.$0http://id.loc.gov/authorities/subjects/sh2008119499
650 0 $aOptical measurements$vCongresses.$0http://id.loc.gov/authorities/subjects/sh2008108676
650 0 $aComputer vision$xIndustrial applications$vCongresses.$0http://id.loc.gov/authorities/subjects/sh2009121257
700 1 $aBatchelor, Bruce G.$0http://id.loc.gov/authorities/names/n85042682
700 1 $aMiller, John W. V.$0http://id.loc.gov/authorities/names/n98023517
700 1 $aSolomon, Susan Snell.$0http://id.loc.gov/authorities/names/n93074518
710 2 $aSociety of Photo-optical Instrumentation Engineers.$0http://id.loc.gov/authorities/names/n78088934
710 2 $aMachine Vision Association of SME.$0http://id.loc.gov/authorities/names/n85073229
830 0 $aProceedings of SPIE--the International Society for Optical Engineering ;$vv. 3521.$0http://id.loc.gov/authorities/names/n42030541
852 00 $boff,eng$hTA1634$i.M3355 1998