Record ID | marc_columbia/Columbia-extract-20221130-005.mrc:546152363:1684 |
Source | marc_columbia |
Download Link | /show-records/marc_columbia/Columbia-extract-20221130-005.mrc:546152363:1684?format=raw |
LEADER: 01684fam a2200373 a 4500
001 2430253
005 20220616043459.0
008 981113t19981998wau b 101 0 eng d
010 $a 99211211
020 $a0819428817
035 $a(OCoLC)40307909
035 $a(OCoLC)ocm40307909
035 $9APX5834CU
035 $a(NNC)2430253
035 $a2430253
040 $aCU-S$cCU-S$dDLC
042 $alccopycat
050 04 $aTA418.7$b.S293 1998
082 00 $a620/.44$221
245 00 $aScattering and surface roughness II :$b21-23 July 1998, San Diego, California /$cZu-Han Gu, Alexei A. Maradudin, chairs/editors ; sponsored ... by SPIE--the International Society for Optical Engineering.
260 $aBellingham, Wash., USA :$bSPIE,$c[1998], ©1998.
300 $avii, 382 pages :$billustrations ;$c28 cm.
336 $atext$btxt$2rdacontent
337 $aunmediated$bn$2rdamedia
490 1 $aSPIE proceedings series ;$vv. 3426
504 $aIncludes bibliographical references and index.
650 0 $aSurface roughness$xMeasurement$vCongresses.
650 0 $aLight$xScattering$vCongresses.$0http://id.loc.gov/authorities/subjects/sh2009129810
650 0 $aElectromagnetic waves$xScattering$vCongresses.
700 1 $aGu, Zu-Han.$0http://id.loc.gov/authorities/names/n89638758
700 1 $aMaradudin, Alexei A.,$d1931-$0http://id.loc.gov/authorities/names/n78093541
710 2 $aSociety of Photo-optical Instrumentation Engineers.$0http://id.loc.gov/authorities/names/n78088934
830 0 $aProceedings of SPIE--the International Society for Optical Engineering ;$vv. 3426.$0http://id.loc.gov/authorities/names/n42030541
852 00 $boff,eng$hTA418.7$i.S293 1998g