| Record ID | marc_columbia/Columbia-extract-20221130-005.mrc:571510267:1730 |
| Source | marc_columbia |
| Download Link | /show-records/marc_columbia/Columbia-extract-20221130-005.mrc:571510267:1730?format=raw |
LEADER: 01730mam a2200349 a 4500
001 2451921
005 20220616050038.0
008 991110t19991999wau 101 0 eng d
020 $a0819432709
035 $a(OCoLC)ocm42803631
035 $9AQA0380CU
035 $a(NNC)2451921
035 $a2451921
040 $aCUS$cCUS
090 $aTA418.7$b.R66 1999
245 00 $aRough surface scattering and contamination :$b21-23 July 1999, Denver, Colorado /$cPhilip T. Chen, Zu-Han Gu, Alexei A. Maradudin, chairs/editors ; sponsored ... by SPIE--the International Society for Optical Engineering.
260 $aBellingham, Wash., USA :$bSPIE,$c[1999], ©1999.
300 $avii, 404 pages :$billustrations (some color) ;$c28 cm.
336 $atext$btxt$2rdacontent
337 $aunmediated$bn$2rdamedia
490 1 $aSPIE proceedings series,$x0277-786X ;$vv. 3784
504 $aIncludes bibliographical references and index.
650 0 $aSurface roughness$xMeasurement$vCongresses.
650 0 $aLight$xScattering$vCongresses.$0http://id.loc.gov/authorities/subjects/sh2009129810
650 0 $aSurface contamination$vCongresses.
650 0 $aSpace vehicles$xContamination$vCongresses.
700 1 $aChen, Philip T.$0http://id.loc.gov/authorities/names/no99007672
700 1 $aGu, Zu-Han.$0http://id.loc.gov/authorities/names/n89638758
700 1 $aMaradudin, Alexei A.,$d1931-$0http://id.loc.gov/authorities/names/n78093541
710 2 $aSociety of Photo-optical Instrumentation Engineers.$0http://id.loc.gov/authorities/names/n78088934
830 0 $aProceedings of SPIE--the International Society for Optical Engineering ;$vv. 3784.$0http://id.loc.gov/authorities/names/n42030541
852 00 $boff,eng$hTA418.7$i.R66 1999g