MARC Record from marc_columbia

LEADER: 05325mam a2200349 a 4500
001 2076226
005 20220615200156.0
008 971013t19971997wau 101 0 eng d
020 $a081942563X
035 $a(OCoLC)ocm37775946
035 $9AMW3063CU
035 $a(NNC)2076226
035 $a2076226
040 $aCUS$cCUS$dOrLoB-B
245 00 $aScattering and surface roughness :$b30-31 July 1997, San Diego, California /$cZu-Han Gu, Alexei A. Maradudin, chairs/editors ; sponsored ... by SPIE--The International Society for Optical Engineering.
260 $aBellingham, Wash., USA :$bSPIE,$c[1997], ©1997.
300 $aix, 338 pages :$billustrations ;$c28 cm.
336 $atext$btxt$2rdacontent
337 $aunmediated$bn$2rdamedia
490 1 $aSPIE proceedings series ;$vv. 3141
504 $aIncludes bibliographical references and index.
505 00 $tIn-situ measurement of roughness spectra using diffuse scattering /$rK. L. Kavanagh --$tApplication of circular and spherical statistics for the interpretation of BRDF measurements /$rH. Rothe and D. Hueser --$tScattering of electromagnetic waves from a one-dimensional random metal surface with a localized defect /$rA. V. Shchegrov and A. A. Maradudin --$tSensitivity of far-field speckle pattern to the small local changes of the rough surface geometry /$rM. A. Josse, Z. Q. Lin and Z.-H. Gu --$tScanning laser method for measuring surface morphology /$rS. Weiser --$tSurface roughness in sputtered tin oxide films studied by light scattering and atomic force microscopy /$rT. Lindstrom, J. Isidorsson and G. A. Niklasson [et al.] --$tQuality assessment of supersmooth to rough surfaces by multiple-wavelength light scattering measurement /$rA. Duparre and S. Gliech --$tScattering from sinusoidal gratings /$rB. C. Park, T. V. Vorburger and T. A. Germer [et al.] --
505 80 $tDevelopment of a smooth-surface microroughness standard /$rB. W. Scheer and J. C. Stover --$tDressed Rayleigh expansion for rough surface scattering /$rP. Tran --$tAnalysis of near-field optical image of a deterministic surface structure using an exact Rayleigh approach /$rS. Wang --$tScatter-probe near-field optical microscopy of metallic surfaces /$rE. R. Mendez, P. Negrete-Regagnon and S. A. Zavala [et al.] --$tTransfer function characterization of scattering surfaces revisited /$rJ. E. Harvey and C. L. Vernold --$tComparison of Harvey-Shack scatter theory with experimental measurements /$rC. L. Vernold and J. E. Harvey --$tEnhanced backscattering of light from a randomly rough interface between a dipole-active medium and a dielectric /$rT. A. Leskova, A. A. Maradudin and A. V. Shchegrov --$tTransverse correlation length for randomly rough surfaces: two-dimensional roughness /$rS. Simeonov, A. R. McGurn and A. A. Maradudin --
505 80 $tScattering by randomly rough two-dimensional dielectric surfaces /$rE. I. Chaikina, R. Hernandez-Walls and E. R. Mendez --$tStokes matrix in cortical scattering from a one-dimensional randomly rough metal surface /$rI. V. Novikov and A. A. Maradudin --$tSurface plasmon polaritons in light scattering from free-standing randomly rough thin metal films /$rJ. Q. Lu and A. A. Maradudin --$tDesign review of an in-situ bidirectional reflectometer /$rM. T. Beecroft and P. R. Mattison --$tFinal design, assembly, and testing of a space-based total integrated scatter instrument /$rJ. B. Hadaway, A. Ahmad and J. M. Bennett --$tGoniometric optical scatter instrument for bidirectional reflectance distribution function measurements with out-of-plane and polarimetry capabilities /$rT. A. Germer and C. C. Asmail --$tMemory effect in the double passage of waves through a one-dimensional random phase screen /$rZ. Q. Lin and Z.-H. Gu --$tCalibration of optical components for the DS-1 space probe /$rR. R. Zito --
505 80 $tSpeckle correlations in the light scattered and transmitted by dielectric and metal films with rough surfaces /$rA. R. McGurn and A. A. Maradudin --$tMemory effect from a one-dimensional rough dielectric film on a glass substrate /$rZ.-H. Gu and J. Q. Lu --$tPhenomenological BRDF modeling for engineering applications /$rJ. C. Jafolla, J. A. Stokes and R. J. Sullivan --$tGreen function for flourescence from spherical particles located on a substrate /$rG. W. Videen, S. C. Hill and J. D. Pendleton --$tScanning scattering microscope for surface and buried interface roughness and defect imaging /$rJ. Lorincik, J. Fine and G. Gillen --$tScattering from planar surfaces with magnetic and thermal fluctuations /$rM. Lehman --$tToward a model accounting for the impact of surface treatment on the performances of scintillation counters /$rC. Moisan, A. Levin and H. Laman.
650 0 $aSurface roughness$xMeasurement$vCongresses.
650 0 $aLight$xScattering$vCongresses.$0http://id.loc.gov/authorities/subjects/sh2009129810
700 1 $aGu, Zu-Han.$0http://id.loc.gov/authorities/names/n89638758
700 1 $aMaradudin, Alexei A.,$d1931-$0http://id.loc.gov/authorities/names/n78093541
710 2 $aSociety of Photo-optical Instrumentation Engineers.$0http://id.loc.gov/authorities/names/n78088934
830 0 $aProceedings of SPIE--the International Society for Optical Engineering ;$vv. 3141.$0http://id.loc.gov/authorities/names/n42030541
852 00 $boff,eng$hTA418.7$i.S33 1997g