Record ID | marc_columbia/Columbia-extract-20221130-006.mrc:189203022:1502 |
Source | marc_columbia |
Download Link | /show-records/marc_columbia/Columbia-extract-20221130-006.mrc:189203022:1502?format=raw |
LEADER: 01502cam a22003491 4500
001 2660799
005 20221012214622.0
008 700928s1968 nyua b 000 0 eng
010 $a 68018663
015 $aGB68-19292
035 $a(OCoLC)ocm00440556
035 $9ARA8242CU
035 $a(NNC)2660799
035 $a2660799
040 $aDLC$cDLC$dUKM$dZCU
050 00 $aTK6580$b.C74 1968
082 00 $a621.3848/1
100 1 $aCrispin, J. W.$q(John W.)$0http://id.loc.gov/authorities/names/nr92030879
245 10 $aMethods of radar cross-section analysis /$cby members of the staff of the Conductron Corporation: J. J. Bowman [and others] edited by J. W. Crispin, Jr., and K. M. Siegel.
260 $aNew York :$bAcademic Press,$c1968.
300 $axiv, 426 pages :$billustrations ;$c24 cm.
336 $atext$btxt$2rdacontent
337 $aunmediated$bn$2rdamedia
490 1 $aElectrical science
504 $aIncludes bibliographies.
650 0 $aRadar.$0http://id.loc.gov/authorities/subjects/sh85110293
650 0 $aRadar cross sections.$0http://id.loc.gov/authorities/subjects/sh92006463
700 1 $aSiegel, K. M.$q(Keeve Milton),$d1923-$eauthor.$4http://id.loc.gov/vocabulary/relators/aut$0http://id.loc.gov/authorities/names/nr92030878
700 1 $aBowman, J. J.$0http://id.loc.gov/authorities/names/n86097405
710 2 $aConductron Corporation.
830 0 $aElectrical science series.$0http://id.loc.gov/authorities/names/n83827984
852 00 $boff,eng$hTK6580$i.C74 1968