| Record ID | marc_columbia/Columbia-extract-20221130-006.mrc:190451489:1150 |
| Source | marc_columbia |
| Download Link | /show-records/marc_columbia/Columbia-extract-20221130-006.mrc:190451489:1150?format=raw |
LEADER: 01150cam a2200289 4500
001 2661987
005 20221012214744.0
008 720321s1972 nyua b 001 0 eng
010 $a 72001479
020 $a047172100X
035 $a(OCoLC)ocm00278443
035 $9ARA9451CU
035 $a2661987
040 $aDLC$cDLC$dZCU
050 00 $aTK7870$b.R52
082 0 $a621.381/028
100 1 $aRicketts, L. W.$0http://id.loc.gov/authorities/names/n85138871
245 10 $aFundamentals of nuclear hardening of electronic equipment /$c[by] L. W. Ricketts.
260 $aNew York :$bWiley-Interscience,$c[1972]
300 $axxxv, 548 pages :$billustrations ;$c23 cm
336 $atext$btxt$2rdacontent
337 $aunmediated$bn$2rdamedia
504 $aIncludes bibliographical references.
650 0 $aElectronic apparatus and appliances$xEffect of radiation on.$0http://id.loc.gov/authorities/subjects/sh85042257
650 0 $aElectronic apparatus and appliances$xProtection.$0http://id.loc.gov/authorities/subjects/sh85042265
650 0 $aElectromagnetic pulse.$0http://id.loc.gov/authorities/subjects/sh85042175
852 00 $boff,eng$hTK7870$i.R52