| Record ID | marc_columbia/Columbia-extract-20221130-007.mrc:178148257:1760 |
| Source | marc_columbia |
| Download Link | /show-records/marc_columbia/Columbia-extract-20221130-007.mrc:178148257:1760?format=raw |
LEADER: 01760mam a2200349 a 4500
001 3154581
005 20221019234201.0
008 011206t20012001wau 101 0 eng d
020 $a0819441619
035 $a(OCoLC)ocm48545937
035 $9ATZ2693CU
035 $a(NNC)3154581
035 $a3154581
040 $aCUS$cCUS
090 $aTA418.7$b.S88 2001
245 00 $aSurface scattering and diffraction for advanced metrology :$b1 August 2001, San Diego, USA /$cZu-Han Gu, Alexei A. Maradudin, chairs/editors ; sponsored ... by SPIE--the International Society for Optical Engineering.
260 $aBellingham, Wash., USA :$bSPIE,$c[2001], ©2001.
300 $avii, 164 pages :$billustrations ;$c28 cm.
336 $atext$btxt$2rdacontent
337 $aunmediated$bn$2rdamedia
490 1 $aSPIE proceedings series ;$vv. 4447
504 $aIncludes bibliographical references and index.
650 0 $aSurface roughness$xMeasurement$vCongresses.
650 0 $aDiffractive scattering$vCongresses.
650 0 $aOptical measurements$vCongresses.$0http://id.loc.gov/authorities/subjects/sh2008108676
650 0 $aScattering (Physics)$vCongresses.$0http://id.loc.gov/authorities/subjects/sh2008111217
650 0 $aMetrology$vCongresses.$0http://id.loc.gov/authorities/subjects/sh2010101601
700 1 $aGu, Zu-Han.$0http://id.loc.gov/authorities/names/n89638758
700 1 $aMaradudin, Alexei A.,$d1931-$0http://id.loc.gov/authorities/names/n78093541
710 2 $aSociety of Photo-optical Instrumentation Engineers.$0http://id.loc.gov/authorities/names/n78088934
830 0 $aProceedings of SPIE--the International Society for Optical Engineering ;$vv. 4447.$0http://id.loc.gov/authorities/names/n42030541
852 00 $boff,eng$hTA418.7$i.S93 2001g