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MARC Record from marc_columbia

Record ID marc_columbia/Columbia-extract-20221130-007.mrc:17946348:1505
Source marc_columbia
Download Link /show-records/marc_columbia/Columbia-extract-20221130-007.mrc:17946348:1505?format=raw

LEADER: 01505mam a22003614a 4500
001 3014647
005 20221019192745.0
008 000925t20012001gw a b 001 0 eng
010 $a 00049275
016 7 $a95980899X$2GyFmDB
020 $a3540678417 (alk. paper)
035 $a(OCoLC)ocm45093705
035 $9ATG1141CU
035 $a(NNC)3014647
035 $a3014647
040 $aDLC$cDLC$dOHX$dC#P
042 $apcc
050 00 $aTA417.23$b.F85 2001
072 7 $aTA$2lcco
082 00 $a620.1/1299$221
100 1 $aFultz, B.$q(Brent)$0http://id.loc.gov/authorities/names/n94109709
245 10 $aTransmission electron microscopy and diffractometry of materials /$cBrent Fultz, James Howe.
260 $aBerlin ;$aNew York :$bSpringer,$c[2001], ©2001.
300 $axix, 748 pages :$billustrations ;$c24 cm
336 $atext$btxt$2rdacontent
337 $aunmediated$bn$2rdamedia
504 $aIncludes bibliographical references and index.
500 $6 0$aPhysics and astronomy online library.$a"Physics and astronomy online library."$0http://id.loc.gov/authorities/names/n2001000188
650 0 $aMaterials$xMicroscopy.$0http://id.loc.gov/authorities/subjects/sh85082081
650 0 $aTransmission electron microscopy.$0http://id.loc.gov/authorities/subjects/sh93001918
650 0 $aX-ray diffractometer.$0http://id.loc.gov/authorities/subjects/sh85148734
700 1 $aHowe, James M.,$d1955-$0http://id.loc.gov/authorities/names/n96052562
852 00 $boff,eng$hTA417.23$i.F85 2001