| Record ID | marc_columbia/Columbia-extract-20221130-007.mrc:335372348:1805 |
| Source | marc_columbia |
| Download Link | /show-records/marc_columbia/Columbia-extract-20221130-007.mrc:335372348:1805?format=raw |
LEADER: 01805mam a2200361 a 4500
001 3336588
005 20221020043644.0
008 020828t20022002wau 101 0 eng d
020 $a0819445444
035 $a(OCoLC)ocm50496954
035 $9AUY6160CU
035 $a(NNC)3336588
035 $a3336588
040 $aCUS$cCUS
090 $aTA1540$b.I543 2002
245 00 $aInterferometry XI :$btechniques and analysis, 8-10 July 2002, Seattle USA /$cKatherine Creath, Joanna Schmit, chairs/editors ; sponsored ... by SPIE--the International Society for Optical Engineering ; cooperating organizations, The Boeing Company (USA) [and others].
246 3 $aInterferometry 11
246 3 $aInterferometry eleven
260 $aBellingham, Wash., USA :$bSPIE,$c[2002], ©2002.
300 $axii, 426 pages :$billustrations ;$c28 cm.
336 $atext$btxt$2rdacontent
337 $aunmediated$bn$2rdamedia
490 1 $aSPIE proceedings series,$x0277-786X ;$vv. 4777
504 $aIncludes bibliographical references and index.
650 0 $aInterferometry$xMethodology$vCongresses.
650 0 $aMeasurement$vCongresses.$0http://id.loc.gov/authorities/subjects/sh2008107149
650 0 $aMetrology$vCongresses.$0http://id.loc.gov/authorities/subjects/sh2010101601
700 1 $aCreath, Katherine.$0http://id.loc.gov/authorities/names/n86013874
700 1 $aSchmit, Joanna.$0http://id.loc.gov/authorities/names/no2002095531
710 2 $aSociety of Photo-optical Instrumentation Engineers.$0http://id.loc.gov/authorities/names/n78088934
710 2 $aBoeing Company.$0http://id.loc.gov/authorities/names/n79134057
830 0 $aProceedings of SPIE--the International Society for Optical Engineering ;$vv. 4777.$0http://id.loc.gov/authorities/names/n42030541
852 00 $boff,eng$hQC410.9$i.I583 2002g