MARC Record from marc_columbia

LEADER: 02150cam a22004578i 4500
001 3468715
005 20221020075709.0
008 770811s1977 dcu f000 0 eng
010 $a 77608178
020 $c$2.00 (pbk. :)
035 $a(OCoLC)ocm03238790
035 $9AJF4840DC
035 $a(NNC)3468715
035 $a3468715
037 $b20402
040 $aDLC$cDLC$dGPO$dMvI-ocm$dMvI
074 $a247
082 0 $a602/.1 s$a621.3815/2/028
086 0 $aC 13.10:400-40
099 $aC 13.10:400-40
100 1 $aGoodman, Alvin M.$0http://id.loc.gov/authorities/names/n50035289
245 12 $aA 25-kV bias-isolation unit for 1-MHz capacitance and conductance measurements /$cAlvin M. Goodman ; RCA Laboratories.
260 $aWashington :$bDepartment of Commerce, National Bureau of Standards : for sale by the Supt. of Docs., U.S. Govt. Print. Off.,$c1977.
336 $atext$btxt$2rdacontent
337 $aunmediated$bn$2rdamedia
490 1 $aSemiconductor measurement technology
490 1 $aNBS special publication ;$v400-40
500 $aActivity was supported by Defense Research Projects Agency and National Bureau of Standards, and funded by Defense Advanced Research Agency under ARPA Order 2397, Program Code 6D10.
500 $aIssued September 1977.
504 $aBibliography: p. 49.
500 $aCODEN: XNBSAV
650 0 $aSemiconductors$xTesting.$0http://id.loc.gov/authorities/subjects/sh85119917
650 0 $aElectric capacity.$0http://id.loc.gov/authorities/subjects/sh85041605
650 0 $aElectric conductivity.$0http://id.loc.gov/authorities/subjects/sh85041621
650 0 $aElectric meters.$0http://id.loc.gov/authorities/subjects/sh85041831
710 1 $aUnited States.$bNational Bureau of Standards.$0http://id.loc.gov/authorities/names/n79021148
710 1 $aUnited States.$bDefense Advanced Research Projects Agency.$0http://id.loc.gov/authorities/names/n79004228
710 2 $aRCA Laboratories.$0http://id.loc.gov/authorities/names/n82206028
830 0 $aSemiconductor measurement technology.
830 0 $aNBS special publication ;$v400-40.
852 30 $boff,docs$hC 13.10:400-40