| Record ID | marc_columbia/Columbia-extract-20221130-007.mrc:481061256:2067 |
| Source | marc_columbia |
| Download Link | /show-records/marc_columbia/Columbia-extract-20221130-007.mrc:481061256:2067?format=raw |
LEADER: 02067cam a2200457 i 4500
001 3483183
005 20221020080437.0
008 800311s1980 xx a f000 0 eng d
010 $a 79600161
020 $c$3.75 (pbk. :)
035 $a(OCoLC)ocm06068240
035 $9AJG9318DC
035 $a(NNC)3483183
035 $a3483183
037 $b20402
040 $aZYU$cZYU$dGPO$dMvI
074 $a247
086 0 $aC 13.10:400-16
099 $aC 13.10:400-16
100 1 $aKenney, James M.$0http://id.loc.gov/authorities/names/n95085359
245 10 $aModulation measurements for microwave mixers /$cJames M. Kenney, Center for Electronics and Electrical Engineering, National Engineering Laboratory, National Bureau of Standards.
260 $aWashington :$bDepartment of Commerce, National Bureau of Standards : for sale by the Supt. of Docs., U.S. Govt. Print. Off.,$c1980.
336 $atext$btxt$2rdacontent
337 $aunmediated$bn$2rdamedia
490 1 $aSemiconductor measurement technology
490 1 $aNBS special publication ;$v400-16
500 $aSupported by the Naval Electronics Systems Command and the National Bureau of Standards.
500 $aCovers period from 1/1/70 to 3/31/74.
500 $aFinal report.
500 $aIssued Feb. 1980.
500 $aCODEN: XMBSAV.
504 $aIncludes bibliographical references.
650 0 $aMicrowave measurements.$0http://id.loc.gov/authorities/subjects/sh85084966
650 0 $aMixing circuits.$0http://id.loc.gov/authorities/subjects/sh85086324
650 0 $aDiodes, Semiconductor$xMeasurement.
710 2 $aCenter for Electronics and Electrical Engineering (U.S.)$0http://id.loc.gov/authorities/names/n78089738
710 1 $aUnited States.$bNaval Electronic Systems Command.$0http://id.loc.gov/authorities/names/n79100839
710 1 $aUnited States.$bNational Bureau of Standards.$0http://id.loc.gov/authorities/names/n79021148
830 0 $aSemiconductor measurement technology.
830 0 $aNBS special publication ;$v400-16.
852 30 $boff,docs$hC 13.10:400-16