| Record ID | marc_columbia/Columbia-extract-20221130-008.mrc:510384673:1562 |
| Source | marc_columbia |
| Download Link | /show-records/marc_columbia/Columbia-extract-20221130-008.mrc:510384673:1562?format=raw |
LEADER: 01562cam a2200385 a 4500
001 3954955
005 20221027005613.0
008 910104t19911991txu 001 0 eng
010 $a 89078495
020 $a0890792550 :$c$85.00
020 $a0890792569 (pbk.)
035 $a(OCoLC)20992833
035 $a(OCoLC)ocm20992833
035 $a(CStRLIN)NYCM91-B68
035 $9AEX0256HS
035 $a(NNC)3954955
035 $a3954955
040 $aDLC$cDLC$dDLC$dCOc$dRPB$dNNC-M
050 00 $aBF176$b.T43 1990
082 00 $a150/.28/7$220
245 00 $aTests :$ba comprehensive reference for assessments in psychology, education, and business /$cRichard C. Sweetland, Daniel J. Keyser, general editors.
250 $a3rd ed.
260 $aAustin, TX :$bPro-Ed,$c[1991], ©1991.
300 $axiv, 1250 pages ;$c24 cm
336 $atext$btxt$2rdacontent
337 $aunmediated$bn$2rdamedia
500 $aIncludes indexes.
650 2 $aPsychological Tests.$0https://id.nlm.nih.gov/mesh/D011581
650 2 $aEducational Measurement.$0https://id.nlm.nih.gov/mesh/D004521
650 2 $aAptitude Tests.$0https://id.nlm.nih.gov/mesh/D001077
650 0 $aEducational tests and measurements.$0http://id.loc.gov/authorities/subjects/sh85041154
650 0 $aOccupational aptitude tests.$0http://id.loc.gov/authorities/subjects/sh85093833
700 1 $aSweetland, Richard C.,$d1931-$0http://id.loc.gov/authorities/names/n83208187
700 1 $aKeyser, Daniel J.,$d1935-$0http://id.loc.gov/authorities/names/n84008612
852 00 $boff,hsl$hBF176$i.T28 1991