| Record ID | marc_columbia/Columbia-extract-20221130-009.mrc:127676073:2775 |
| Source | marc_columbia |
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LEADER: 02775cam a2200445Ia 4500
001 4089614
005 20221027033406.0
008 030415t20032003waua b 101 0 eng d
020 $a0819448702
035 $a(OCoLC)ocm52054598
035 $a(NNC)4089614
035 $a4089614
040 $aLHL$cLHL
090 $aQC367$b.L53 2002
245 00 $aLightmetry 2002 :$bmetrology and testing techniques using light : 14-16 May, 2002, Warsaw, Poland /$cMaksymilian Pluta, Mariusz Szyjer, editors ; Ewa Powichrowska, co-editor ; organized by SPIE Poland Chapter [and] Institute of Applied Optics (Poland) ; sponsored by SPIE--the International Society for Optical Engineering [and] State Committee for Scientific Research (Poland) ; published by Spie--the International Society for Optical Engineering.
246 30 $aLightmetry : metrology, spectroscopy, and testing techniques using light
246 30 $aMetrology and testing techniques using light
260 $aBellingham, Wash. :$bSPIE,$c[2003], ©2003.
300 $axx, 338 pages :$billustrations ;$c28 cm.
336 $atext$btxt$2rdacontent
337 $aunmediated$bn$2rdamedia
490 1 $aSPIE Poland Chapter proceedings ;$v68
490 1 $aSPIE proceedings series ;$vv. 5064
500 $aPrevious conference entitled: Lightmetry : metrology, spectroscopy, and testing techniques using light.
504 $aIncludes bibliographical references and author index.
650 0 $aLight$vCongresses.
650 0 $aPolarization (Light)$vCongresses.
650 0 $aOptical measurements$vCongresses.$0http://id.loc.gov/authorities/subjects/sh2008108676
650 0 $aOptical detectors$vCongresses.$0http://id.loc.gov/authorities/subjects/sh2008108670
650 0 $aMeasurement$vCongresses.$0http://id.loc.gov/authorities/subjects/sh2008107149
700 1 $aPluta, Maksymilian.$0http://id.loc.gov/authorities/names/n87855436
700 1 $aSzyjer, Mariusz.$0http://id.loc.gov/authorities/names/no93033791
700 1 $aPowichrowska, Ewa.$0http://id.loc.gov/authorities/names/no2001094366
710 2 $aSociety of Photo-optical Instrumentation Engineers.$0http://id.loc.gov/authorities/names/n78088934
710 2 $aSociety of Photo-optical Instrumentation Engineers.$bPoland Chapter.$0http://id.loc.gov/authorities/names/nr93050346
710 2 $aInstitute of Applied Optics (Poland)$0http://id.loc.gov/authorities/names/n96054377
710 2 $aKomitet Badań Naukowych (Poland)$0http://id.loc.gov/authorities/names/n93040767
830 0 $aProceedings of SPIE--the International Society for Optical Engineering ;$vv. 5064.$0http://id.loc.gov/authorities/names/n42030541
830 0 $aSPIE Poland Chapter proceedings ;$v68.$0http://id.loc.gov/authorities/names/n95022267
852 00 $boff,eng$hQC367$i.L53 2002g