MARC Record from marc_columbia

LEADER: 10408cam a2200349 a 4500
001 5435445
005 20221110034404.0
008 050523t20052005paua b 101 0 eng
020 $a155899789X
035 $a(OCoLC)ocm60422905
035 $a(NNC)5435445
035 $a5435445
040 $aLHL$cLHL$dIXA$dNNC$dOrLoB-B
090 $aTA418.7$b.F86 2004
245 00 $aFundamentals of nanoindentation and nanotribology III :$bsymposium held November 29-December 3, 2004, Boston, Massachusetts, U.S.A. /$ceditors, Kathryn J. Wahl [and others].
260 $aWarrendale, Pa. :$bMaterials Research Society,$c[2005], ©2005.
300 $axiii, 410 pages :$billustrations ;$c24 cm.
336 $atext$btxt$2rdacontent
337 $aunmediated$bn$2rdamedia
490 1 $aMaterials Research Society symposium proceedings ;$vv. 841
505 00 $tMeasurement of crystal lattice rotations under nanoindents in copper /$rKirsten K. McLaughlin, Nadia A. Stelmashenko, Stephen J. Lloyd, Luc J. Vandeperre and William J. Clegg -- $tAn experimental evaluation of the constant [beta] relating the contact stiffness to the contact area in nanoindentation /$rJeremy H. Strader, Sanghoon Shim, Hongbin Bei, W. C. Oliver and G. M. Pharr -- $tThe mechanics of nanoimprint forming /$rGraham L. W. Cross, Richard M. Langford, Barry S. O'Connell and John B. Pethica -- $tAspects of tip shape characterization for nanoindentation of compliant materials /$rMark R. VanLandingham, Thomas F. Juliano and Matthew J. Hagon -- $tEffects of surface stress on the load-depth curves of depth-sensing indentation /$rQ. Wang and K. Ozaki -- $tA critical examination of the Berkovich vs. Conical indentation based on 3D finite element calculation /$rSanghoon Shim, Warren C. Oliver and George M. Pharr -- $tCorrelated single molecule fluorescence and scanning probe microscopies : applications to the study of soft materials /$rAndrea L. Slade, James E. Shaw, Guocheng Yang, Neetu Chhabra and Christopher M. Yip -- $tNanomechanical and microstructural properties of Bombyx mori silk films /$rDonna M. Ebenstein, Jaehyung Park, David L. Kaplan and Kathryn J. Wahl -- $tNanoscale characterization of salivary pellicle /$rMichelle E. Dickinson and Adrian B. Mann -- $tNanomechanical testing of hydrated biomaterials : sample preparation, data validation and analysis /$rJessica D. Kaufman and Catherine M. Klapperich -- $tElastic modulus of dental enamel : effect of enamel prism orientation and mineral content /$rV. L. Ferguson, Alan Boyde and Andrew J. Bushby -- $tContribution of collagen, mineral and water phases to the nanomechanical properties of bone /$rAmanpreet K. Bembey, Vanessa Koonjul, Andrew J. Bushby, Virginia L. Ferguson and Alan Boyde -- $tNanoindentation of bone in a physiological environment /$rR. Akhtar, S. Morse and P. M. Mummery -- $tEffect of fluoride on mechanical properties of teeth demineralized by use of orthodontic appliances /$rClaudia Centeno, Ulises Ruiz, Oscar Contreras and Enrique C. Samano -- $tEffects of osteopontin deficiency and aging on nanomechanics of mouse bone /$rB. Kavukcuoglu, C. West, D. T. Denhardt and A. B. Mann -- $tSpatially dependent mechanical properties of rat whiskers for tactile sensing /$rE. K. Herzog, D. F. Bahr, C. D. Richards, R. F. Richards and D. M. Rector -- $tNano-mechanical investigation of the Byssal cuticle, a protective coating of a bio-elastomer /$rNiels Holten-Andersen, Nelle Slack, Frank Zok and J. Herbert Waite -- $tOn the measurement of creep by nanoindentation with continuous stiffness techniques /$rAndrei Rar, Sangjoon Sohn, Warren C. Oliver, David L. Goldsby, Terry E. Tullis and George M. Pharr -- $tMultiple-frequency nanoindentation testing /$rA. C. Fischer-Cripps -- $tMeasurements of viscoelastic properties of SWNT/polymer composite films using nanoindentation /$rHongbing Lu, Gang Huang, Bo Wang, Arif Mamedov and Sachin Gupta -- $tDisplacement modulation based dynamic nanoindentation for viscoelastic material characterization /$rSehaj P. Singh, Raman P. Singh and James F. Smith -- $tOn the measurement of material creep parameters by nanoindentation /$rJ. A. LaManna, W. C. Oliver and G. M. Pharr -- $tHigh temperature nanoindentation for the study of flow defects /$rC. A. Schuh, J. K. Mason, A. C. Lund and A. M. Hodge -- $tHigh temperature deformation of AlN/CrN multilayers using nanoindentation /$rF. Giuliani, A. Goruppa, S. J. Lloyd, D. Teer and W. J. Clegg -- $tMolecular mobility and confined plasticity in NEMS applications /$rRene M. Overney and Scott Sills -- $tOn factors affecting the extraction of elastic modulus by nanoindentation of organic polymer films /$rF. Iacopi, M. Laknin, A. Mulloy, J. M. J. den Toonder, D. Vanhaeren and S. H. Brongersma -- $tViscoelastic characterization of polymers using dynamic instrumented indentation /$rC. C. White, P. L. Drzal and M. R. VanLandingham -- $tIndentation creep and relaxation measurements of polymers /$rMark R. VanLandingham, Peter L. Drzal and Christopher C. White -- $tNanomechanical quantification of polymer energy absorption /$rCatherine A. Tweedie, James F. Smith and Krystyn J. Van Vliet -- $tSpherical indentation creep following ramp loading /$rMichelle L. Oyen -- $tNanomechanical properties of UV degraded TiO[subscript 2]/epoxy nanocomposites /$rStephanie Scierka, Peter L. Drzal, Amanda L. Forster and Stephanie Svetlik -- $tSome issues of rough surface contact plasticity at micro- and nano-scales /$rY. F. Gao, A. F. Bower and K.-S. Kim -- $tMultiscale modeling of two dimensional rough surface contacts /$rBinquan Luan, Sangil Hyun, Mark O. Robbins and Noam Bernstein -- $tMechanical properties of wear tested LIGA nickel /$rN. R. Moody, J. M. Jungk, M. S. Kennedy, S. V. Prasad, D. F. Bahr and W. W. Gerberich -- $tTEM observation of microstructural change of silicon single crystal caused by scratching tests using SPM /$rM. Takagi, K. Onodera, H. Iwata, T. Imura, K. Sasaki and H. Saka -- $tThe atomic scale removal mechanism during chemomechanical polishing of silicon : an atomic force microscopy study /$rFutoshi Katsuki and Junji Watanabe -- $tFracture mechanisms of GaAs under nanoscratching /$rJ.-M. Solletti, M. Parlinska-Wojtan, J. Tharian, K. Wasmer, J. Michler, C. Ballif, D. Schulz and A. Karimi -- $tFriction and wear properties of ALD coated MEMS /$rCorina Nistorica, Igor Gory, George D. Skidmore, Fadziso M. Mantiziba and Bruce E. Gnade -- $tNanoindentation of ion implanted and deposited amorphous silicon /$rJ. S. Williams, B. Haberl and J. E. Bradby -- $tCross-sectional TEM studies of indentation-induced phase transformations in Si : indenter angle effects /$rSongqing Wen, James Bentley, Jae-il Jang and G. M. Pharr -- $tIn situ infrared (IR) detection and heating of the high pressure phase of silicon during scratching test /$rLei Dong, John A. Patten and Jimmie A. Miller -- $tMicro-Raman mapping and analysis of indentation-induced phase transformations in Germanium /$rJae-il Jang, M. J. Lance, Songqing Wen, J. J. Huening, R. J. Nemanich and G. M. Pharr -- $tModeling indentation in linear viscoelastic solids /$rYang-Tse Cheng and Che-Min Cheng -- $tDislocation nucleation at a surface step by a multiscale approach /$rChengzhi Li, Darren Segall and Guanshui Xu -- $tDetermination of plastic properties of polycrystalline metallic materials by nanoindentation - experiments and finite element simulations /$rKarsten Durst, Bjorn Backes and Mathias Goken -- $tModeling of nanoindentation and microstructural ductile behavior in metallic material systems /$rJeong Beom Ma, W. Ashmawi, M. A. Zikry, D. Schall and D. W. Brenner -- $tAn analytical approach for relating hardness and yield strength for materials with high ratio of yield strength to young modulus /$rLuc J. Vandeperre, Finn Giuliani and William J. Clegg -- $tOn the mechanics of indentation induced lateral cracking /$rXi Chen -- $tMechanisms underlying hardness numbers /$rJohn J. Gilman -- $tAn investigation of non-linear stress-strain behavior of thin metal films /$rN. Huber, T. Dietz and E. Tyulyukovskiy -- $tNanoindentation of multilayer PZT/Pt/SiO[subscript 2] thin film systems on silicon wafers for MEMS applications /$rC. Chima-Okereke, M. J. Reece, A. J. Bushby, R. W. Whatmore and Q. Zhang -- $tMicrobridge nanoindentation testing of plasma-enhanced chemical vapor deposited silicon oxide films /$rZhiqiang Cao, Tong-Yi Zhang and Xin Zhang -- $tInvestigation of indentation methods for properties determination in hard film - soft substrate systems /$rM. S. Kennedy, N. R. Moody and D. F. Bahr -- $tNon-destructive measurement of the density of thin coatings by a combination of instrumented (nano) indentation and acoustical techniques /$rNigel M. Jennett, Giles Aldrich-Smith and Antony S. Maxwell -- $tA nanoindentation study of thermally-grown-oxide films on silicon /$rFatih Helvaci and Junghyun Cho -- $tNano scratching of clear coats and relation to mechanical material properties /$rRolf Nothhelfer-Richter, Eugen Klinke and Claus D. Eisenbach --
500 $a"Symposium R, 'Fundamentals of Nanoindentation and Nanotribology III,' was held November 29-December 3 at the 2004 MRS Fall Meeting in Boston, Massachusetts."--Pref.
504 $aIncludes bibliographical references and indexes.
505 80 $tInitial contact behavior of nanograined Ni-25at.%Al film during nanoindentation /$rHan. Li and Alfonso H. W. Ngan -- $tAcoustic emission analysis of nanoindentation-induced fracture events /$rPawel Dyjak and Raman P. Singh -- $tSpherical load indentation in submicron NiTiCu shape memory thin films /$rR. Hassdorf, J. Feydt, S. Thienhaus, L. Buforn, N. Conte, O. Pykhteev, M. Kruzik, N. Botkin and M. Moske.
650 0 $aSurfaces (Technology)$xTesting$vCongresses.
650 0 $aTribology$vCongresses.$0http://id.loc.gov/authorities/subjects/sh2008113005
650 0 $aNanotechnology$vCongresses.$0http://id.loc.gov/authorities/subjects/sh2008108196
700 1 $aWahl, Kathryn J.,$d1964-$0http://id.loc.gov/authorities/names/n99042655
710 2 $aMaterials Research Society.$bFall Meeting$d(2004 :$cBoston, Mass.)$0http://id.loc.gov/authorities/names/no2013046582
711 2 $aSymposium on Fundamentals of Nanoindentation and Nanotribology$n(3rd :$d2004 :$cBoston, Mass.)
830 0 $aMaterials Research Society symposia proceedings ;$vv. 841.$0http://id.loc.gov/authorities/names/n42037756
852 00 $boff,eng$hTA418.7$i.F86 2004g