| Record ID | marc_columbia/Columbia-extract-20221130-011.mrc:75624765:2426 |
| Source | marc_columbia |
| Download Link | /show-records/marc_columbia/Columbia-extract-20221130-011.mrc:75624765:2426?format=raw |
LEADER: 02426cam a22003374a 4500
001 5089000
005 20221109214852.0
008 040209t20042004maua b 001 0 eng
010 $a 2003061988
020 $a1402076304
024 $aR6-418195
035 $a(OCoLC)53091189
035 $a(OCoLC)ocm53091189
035 $a(DLC) 2003061988
035 $a(NNC)5089000
035 $a5089000
040 $aDLC$cDLC$dDLC$dOrLoB-B
042 $apcc
050 00 $aTA418.9.T45$bN35 2004
082 00 $a621.3815/2$222
245 00 $aNanoscale phenomena in ferroelectric thin films /$cedited by Seungbum Hong.
260 $aBoston :$bKluwer Academic Publishers,$c[2004], ©2004.
300 $axiv, 288 pages :$billustrations ;$c25 cm
336 $atext$btxt$2rdacontent
337 $aunmediated$bn$2rdamedia
504 $aIncludes bibliographical references and index.
505 00 $gI.$tTesting and characterization of ferroelectric thin film capacitors /$rIn Kyeong Yoo -- $gII.$tSize effects in ferroelectric film capacitors: role of the film thickness and capacitor size /$rIgor Stolichnov -- $gIII.$tFerroelectric thin films for memory applications: nanoscale characterization by scanning force microscopy /$rAlexei Gruverman -- $gIV.$tNanoscale domain dynamics in ferroelectric thin films /$rV. Nagarajan and R. Ramesh -- $gV.$tPolarization switching and fatigue of ferroelectric thin films studied by PFM /$rSeungbum Hong -- $gVI.$tDomain switching and self-polarization in perovskite thin films /$rA. Roelofs, K. Szot and R. Waser -- $gVII.$tDynamic-contact electrostatic force microscopy and its application to ferroelectric domain /$rZ. G. Khim and J. Hong -- $gVIII.$tPolarization and charge dynamics in ferroelectric materials with SPM /$rS. Kalinin and D. A. Bonnell -- $gIX.$tNanoscale investigation of MOCVD-Pb(Zr,Ti)O[subscript 3] thin films using scanning probe microscopy /$rHironori Fujisawa and Masaru Shimizu -- $gX.$tSPM measurements of ferroelectrics at MHz frequencies /$rBryan D. Huey -- $gXI.$tApplication of ferroelectric domains in nanometer scale for high-density storage devices /$rHyunjung Shin.
650 0 $aFerroelectric thin films.$0http://id.loc.gov/authorities/subjects/sh90004716
650 0 $aNanostructured materials.$0http://id.loc.gov/authorities/subjects/sh93000864
700 1 $aHong, Seungbum.$0http://id.loc.gov/authorities/names/n2003015167
852 00 $boff,eng$hTA418.9.T45$iN35 2004