| Record ID | marc_columbia/Columbia-extract-20221130-012.mrc:42656149:1558 |
| Source | marc_columbia |
| Download Link | /show-records/marc_columbia/Columbia-extract-20221130-012.mrc:42656149:1558?format=raw |
LEADER: 01558cam a2200373 a 4500
001 5550852
005 20221121182729.0
008 051219r20051996enka b 001 0 eng
010 $a 95033552
015 $aGB96-36620
019 $a34731011
020 $a0521482666 (hbk.)
020 $a0521017955 (pbk.)
035 $a(OCoLC)ocm33078848
035 $a(NNC)5550852
035 $a5550852
040 $aDLC$cDLC$dUKM$dUBA$dBAKER
050 00 $aTA417.23$b.W36 1996
082 00 $a620/.44$220
100 1 $aWang, Zhong Lin.$0http://id.loc.gov/authorities/names/n95015196
245 10 $aReflection electron microscopy and spectroscopy for surface analysis /$cZhong Lin Wang.
260 $aCambridge ;$aNew York :$bCambridge University Press,$c[1996], ©1996.
300 $axix, 436 pages :$billustrations ;$c26 cm
336 $atext$btxt$2rdacontent
337 $aunmediated$bn$2rdamedia
504 $aIncludes bibliographical references (p. 419-430) and indexes.
650 0 $aMaterials$xMicroscopy.$0http://id.loc.gov/authorities/subjects/sh85082081
650 0 $aSurfaces (Technology)$xAnalysis.$0http://id.loc.gov/authorities/subjects/sh85130751
650 0 $aReflection electron microscopy.$0http://id.loc.gov/authorities/subjects/sh88005209
653 0 $aSurfaces$aAnalysis
650 7 $aMicroscopia eletrônica.$2larpcal
856 42 $3Publisher description$uhttp://www.loc.gov/catdir/description/cam027/95033552.html
856 41 $3Table of contents$uhttp://www.loc.gov/catdir/toc/cam021/95033552.html
852 00 $boff,eng$hTA417.23$i.W36 1996