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MARC Record from marc_columbia

Record ID marc_columbia/Columbia-extract-20221130-025.mrc:168511345:3557
Source marc_columbia
Download Link /show-records/marc_columbia/Columbia-extract-20221130-025.mrc:168511345:3557?format=raw

LEADER: 03557cam a2200625Ma 4500
001 12404118
005 20220528224224.0
006 m o d
007 cr un|||||||||
008 011103m19899999njua obf 001 0 eng d
010 $a 89030273
035 $a(OCoLC)ocm49708634
035 $a(NNC)12404118
040 $aKNOVL$beng$epn$cKNOVL$dOCLCQ$dTEF$dDEBSZ$dOCLCQ$dOCLCE$dCOO$dUMC$dKNOVL$dZCU$dKNOVL$dOCLCF$dOCLCQ$dOCLCO$dKNOVL$dOCL$dOCLCQ$dVT2$dOCLCQ$dCEF$dRRP$dAU@$dWYU$dYOU$dHS0$dUKBTH$dS2H$dUX1$dSXB$dOCLCO
019 $a49270361$a297327156$a468763548$a644722399$a961849192$a988698864$a999581721$a1057936197$a1058876250$a1066540135$a1077798096$a1096905100$a1108993621$a1113039227$a1116704274$a1136277973$a1152044419$a1159662327$a1166998313$a1180918760
020 $a1591240271$q(electronic bk.)
020 $a9781591240273$q(electronic bk.)
020 $a9780815516347$q(v. 1)
020 $a0815516347$q(v. 1)
020 $z0815512007$q(v. 1)
020 $z9780815512004$q(v. 1)
035 $a(OCoLC)49708634$z(OCoLC)49270361$z(OCoLC)297327156$z(OCoLC)468763548$z(OCoLC)644722399$z(OCoLC)961849192$z(OCoLC)988698864$z(OCoLC)999581721$z(OCoLC)1057936197$z(OCoLC)1058876250$z(OCoLC)1066540135$z(OCoLC)1077798096$z(OCoLC)1096905100$z(OCoLC)1108993621$z(OCoLC)1113039227$z(OCoLC)1116704274$z(OCoLC)1136277973$z(OCoLC)1152044419$z(OCoLC)1159662327$z(OCoLC)1166998313$z(OCoLC)1180918760
042 $adlr
050 4 $aQC611.45$b.C42 1989eb
082 04 $a621.3815/2$222
049 $aZCUA
245 00 $aCharacterization of semiconductor materials :$bprinciples and methods /$cedited by Gary E. McGuire.
260 $aPark Ridge, N.J. :$bNoyes Publications,$c©1989-
300 $a1 online resource (volumes <1>) :$billustrations.
336 $atext$btxt$2rdacontent
337 $acomputer$bc$2rdamedia
338 $aonline resource$bcr$2rdacarrier
490 1 $aMaterials science and process technology series
520 $aIncludes chapters on Electrical Characterization, Ion Mass Spectrometry, Photoelectron Spectroscopy, and Ion/Solid Interactions.
504 $aIncludes bibliographical references and index.
588 0 $aPrint version record.
506 $3Use copy$fRestrictions unspecified$2star$5MiAaHDL
533 $aElectronic reproduction.$b[S.l.] :$cHathiTrust Digital Library,$d2010.$5MiAaHDL
538 $aMaster and use copy. Digital master created according to Benchmark for Faithful Digital Reproductions of Monographs and Serials, Version 1. Digital Library Federation, December 2002.$uhttp://purl.oclc.org/DLF/benchrepro0212$5MiAaHDL
583 1 $adigitized$c2010$hHathiTrust Digital Library$lcommitted to preserve$2pda$5MiAaHDL
546 $aEnglish.
650 0 $aSemiconductors$vHandbooks, manuals, etc.
650 6 $aSemi-conducteurs$vGuides, manuels, etc.
650 7 $aSemiconductors.$2fast$0(OCoLC)fst01112198
650 7 $aPhysics.$2hilcc
650 7 $aPhysical Sciences & Mathematics.$2hilcc
650 7 $aElectricity & Magnetism.$2hilcc
655 0 $aElectronic book.
655 4 $aElectronic books.
655 7 $aHandbooks and manuals.$2fast$0(OCoLC)fst01423877
700 1 $aMcGuire, G. E.
776 08 $iPrint version:$tCharacterization of semiconductor materials.$dPark Ridge, N.J. : Noyes Publications, ©1989-$z0815512007$w(DLC) 89030273$w(OCoLC)19221501
830 0 $aMaterials science and process technology series.
856 40 $uhttp://www.columbia.edu/cgi-bin/cul/resolve?clio12404118$zACADEMIC - Electronics & Semiconductors
852 8 $blweb$hEBOOKS