| Record ID | marc_columbia/Columbia-extract-20221130-031.mrc:136971600:3802 |
| Source | marc_columbia |
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035 $a(OCoLC)ocn868795575
035 $a(NNC)15096064
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020 $a9781466554016$q(electronic bk.)
020 $a1466554010$q(electronic bk.)
020 $a1466554002
020 $a9781466554009
020 $a1306124115
020 $a9781306124119
020 $a1138033855
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020 $z9781466554009
020 $z9781138033856
024 7 $a10.1201/b16093$2doi
035 $a(OCoLC)868795575$z(OCoLC)862608519$z(OCoLC)863036534$z(OCoLC)863179731$z(OCoLC)870449997$z(OCoLC)957133001$z(OCoLC)957240627$z(OCoLC)1156332851$z(OCoLC)1192345558$z(OCoLC)1240533480
037 $aCL0500000371$bSafari Books Online
050 4 $aTK7871.85$b.L69 2014
072 7 $aTEC$x009070$2bisacsh
082 04 $a621.38152$bL913
049 $aZCUA
100 1 $aLowe, B. G.,$eauthor.
245 10 $aSemiconductor x-ray detectors /$cB.G. Lowe, R.A. Sareen.
264 1 $aBoca Raton, FL :$bCRC Press,$c[2014]
264 4 $c©20
264 4 $c©2014
300 $a1 online resource :$btext file, PDF
336 $atext$btxt$2rdacontent
337 $acomputer$bc$2rdamedia
338 $aonline resource$bcr$2rdacarrier
347 $adata file
490 1 $aSeries in sensors
504 $aIncludes bibliographical references and index.
505 0 $aChapter 1. Introduction -- chapter 2. Detector response function -- chapter 3. Detector artefacts -- chapter 4. Contacts -- chapter 5. Si(Li) x-ray detectors -- chapter 6. HPSi and HPGe x-ray detectors -- chapter 7. X-ray detectors based on silicon lithography and planar technology -- chapter 8. CCD-based x-ray detectors -- chapter 9. Silicon drift x-ray detectors -- chapter 10. Wide bandgap semiconductors -- chapter 11. History of semiconductor x-ray detectors and their applications.
520 $aIdentifying and measuring the elemental x-rays released when materials are examined with particles (electrons, protons, alpha particles, etc.) or photons (x-rays and gamma rays) is still considered to be the primary analytical technique for routine and non-destructive materials analysis. The Lithium Drifted Silicon (Si(Li)) X-Ray Detector, with its good resolution and peak to background, pioneered this type of analysis on electron microscopes, x-ray fluorescence instruments, and radioactive source- and accelerator-based excitation systems. Although rapid progress in Silicon Drift Detectors (SD.
650 0 $aSemiconductors.
650 0 $aX-rays.
650 2 $aSemiconductors
650 2 $aX-Rays
650 6 $aSemi-conducteurs.
650 6 $aRayons X.
650 7 $asemiconductor.$2aat
650 7 $aTECHNOLOGY & ENGINEERING$xMechanical.$2bisacsh
650 7 $aSemiconductors.$2fast$0(OCoLC)fst01112198
650 7 $aX-rays.$2fast$0(OCoLC)fst01181857
700 1 $aSareen, R. A.,$eauthor.
776 08 $iPrint version:$aLowe, B.G.$tSemiconductor X-Ray Detectors.$dHoboken : Taylor and Francis, ©2013$z9781466554009
830 0 $aSensors series.
856 40 $uhttp://www.columbia.edu/cgi-bin/cul/resolve?clio15096064$zTaylor & Francis eBooks
852 8 $blweb$hEBOOKS