Record ID | marc_columbia/Columbia-extract-20221130-031.mrc:163954697:3175 |
Source | marc_columbia |
Download Link | /show-records/marc_columbia/Columbia-extract-20221130-031.mrc:163954697:3175?format=raw |
LEADER: 03175cam a2200577 a 4500
001 15103787
005 20221119233257.0
006 m o d
007 cr |||||||||||
008 141126s2015 flua ob 001 0 eng d
035 $a(OCoLC)ocn898156428
035 $a(NNC)15103787
040 $aUKMGB$beng$epn$cUKMGB$dOCLCO$dOCLCF$dEBLCP$dYDXCP$dOCLCQ$dDEBSZ$dCRCPR$dMERUC$dOCLCQ$dN$T$dOCLCQ$dYDX$dAU@$dWAU$dOCLCQ$dUKMGB$dUKAHL$dK6U$dOCLCO$dSFB$dVT2$dOCLCO$dOCLCQ
015 $aGBB4E7888$2bnb
016 7 $a016977215$2Uk
019 $a908080134$a1058108084$a1260365610$a1281711385
020 $a9781482214369$q(electronic bk.)
020 $a1482214369$q(electronic bk.)
020 $a9781482214352$q(hardback)
020 $a1482214350
024 8 $a40024525894
035 $a(OCoLC)898156428$z(OCoLC)908080134$z(OCoLC)1058108084$z(OCoLC)1260365610$z(OCoLC)1281711385
037 $aTANDF_335653$bIngram Content Group
050 4 $aTK7876 .B375 2015
072 7 $aTEC$x009070$2bisacsh
072 7 $aTJFC$2bicscc
082 04 $a621.3813$223
084 $aTEC008010$aTEC024000$aTEC061000$2bisacsh
049 $aZCUA
100 1 $aBasu, Ananjan,$eauthor.
245 13 $aAn introduction to microwave measurements /$cAnanjan Basu.
264 1 $aBoca Raton :$bCRC Press,$c2015.
300 $a1 online resource
336 $atext$btxt$2rdacontent
336 $astill image$bsti$2rdacontent
337 $acomputer$bc$2rdamedia
338 $aonline resource$bcr$2rdacarrier
504 $aIncludes bibliographical references and index.
588 0 $aCIP data; item not viewed.
505 0 $aFront Cover; Contents; Preface; Acknowledgments; About the Author; Chapter 1: Introduction; Chapter 2: Background Information; Chapter 3: Traditional Measurement Techniques; Chapter 4: Vector Network Analyzer; Chapter 5: Spectrum Analyzer; Chapter 6: Noise Measurements; Chapter 7: Microwave Signal Generation; Chapter 8: Microwave Oscilloscopes; Chapter 9: Wafer Probing; Chapter 10: Application Examples; Appendix 1; Back Cover.
520 $aIntroductionAim and ScopeGeneral Electronic Measurements and Frequency LimitationsApplications and Importance of Microwave MeasurementsOverview of State-of-the-Art Microwave MeasurementsReferencesBackground InformationS-Parameters and Related Black-Box RepresentationSpectra of Commonly Encountered SignalsMicrowave Filters and Directional CouplersMicrowave Mixers, Switches, Attenuators, and ConnectorsConclusionProblemsReferencesTraditional Measurement TechniquesThe Power MeterTransmission MeasurementReflection MeasurementConclusionProblemsReferencesVector Network AnalyzerEnhancement of Scalar M.
650 0 $aMicrowave measurements.
650 0 $aRadio measurements.
650 6 $aMesures micro-ondes.
650 6 $aMesures radioélectriques.
650 7 $aTECHNOLOGY & ENGINEERING$xMechanical.$2bisacsh
650 7 $aMicrowave measurements.$2fast$0(OCoLC)fst01020233
650 7 $aRadio measurements.$2fast$0(OCoLC)fst01087402
776 08 $iPrint version:$z9781482214352
856 40 $uhttp://www.columbia.edu/cgi-bin/cul/resolve?clio15103787$zTaylor & Francis eBooks
852 8 $blweb$hEBOOKS