MARC Record from marc_columbia

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001 15120454
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035 $a(OCoLC)ocn992436747
035 $a(NNC)15120454
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020 $a9781351767675$q(electronic bk.)
020 $a1351767674$q(electronic bk.)
020 $a9781315196640
020 $a1315196646
020 $a9781351767668$q(ePub ebook)
020 $a1351767666
020 $a9781351767651$q(Mobipocket ebook)
020 $a1351767658
020 $z9789814774017
020 $z9814774014
035 $a(OCoLC)992436747$z(OCoLC)992734614$z(OCoLC)994542903$z(OCoLC)995762049$z(OCoLC)1000427807$z(OCoLC)1015213719$z(OCoLC)1077382204$z(OCoLC)1084400960$z(OCoLC)1125078356
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072 7 $aSCI$x000000$2bisacsh
082 04 $a502.8/25$223
049 $aZCUA
100 1 $aLottermoser, Werner,$eauthor.
245 14 $aThe difference electron nanoscope :$bmethods and applications /$cWerner Lottermoser.
264 1 $a[Singapore] :$bPan Stanford Publishing ;$aRoca Raton, FL :$bCRC Press, Taylor & Francis Group,$c[2017]
264 4 $c©2017
300 $a1 online resource :$billustrations
336 $atext$btxt$2rdacontent
337 $acomputer$bc$2rdamedia
338 $aonline resource$bcr$2rdacarrier
505 0 $aCover; Half Title; Title Page; Copyright Page; Table of Contents; Preface; Introduction: What Is a DEN; 1: An Overview on the Methods Involved; 2: The Basic Quantity: The Electric Field Gradient; 3: The Three Pillars of the DEN Method; 3.1 The Experimental Methods to Derive a "Measured" efg; 3.1.1 Fundamentals of Mossbauer Spectroscopy; 3.1.1.1 Features and function of a Mossbauer spectrometer; 3.1.1.2 Evaluation of spectra; 3.1.1.3 Calibration and folding; 3.1.1.4 Sample preparation; 3.1.1.5 Historical background; 3.1.1.6 The Nobel Prize winner Rudolf L. Mossbauer.
505 8 $a3.1.1.7 Later contributions to ... 3.1.2 Single Crystal Mossbauer Spectroscopy; 3.1.2.1 Preparation of the single crystal sample; 3.1.2.2 Orientation of the single crystal individuals; 3.1.2.3 Manufacturing of the oriented single crystal samples; 3.1.3 Nuclear Magnetic Resonance and Nuclear Quadrupole Resonance; 3.1.3.1 Basics; 3.2 The Full Quantitative Method to Calculate an efg from First Principles; 3.2.1 Fundamentals of Theoretical Approaches: Density Functional Theory; 3.2.1.1 Historical background; 3.2.1.2 The Nobel Prize winner Walter Kohn; 3.2.1.3 The Nobel Prize winner John A. Pople.
505 8 $a3.2.1.4 The self-consistent-charge Xa method3.2.1.5 The evaluation of the multi-centre integrals; 3.2.1.6 The Program WIEN2k by Peter Blaha and Karlheinz Schwarz; 3.3 The Semi-Quantitative Approach to Obtain an efg from Diffractometer Data; 3.3.1 Fundamentals of Diffractometry; 3.3.1.1 Bragg procedure; 3.3.1.2 Powder method; 3.3.1.3 Laue procedure; 3.3.1.4 Theoretical background of some crystallographic properties; 3.3.1.5 Historical background; 3.3.1.6 The Nobel Prize winner Max von Laue; 3.3.1.7 Later contributions; 3.3.2 X-Ray Diffraction; 3.3.2.1 The Buerger Precession Camera.
505 8 $a3.3.2.2 The intensity distribution of the reflections3.3.2.3 Generalization of the above example; 3.3.3 Synchrotron Diffraction; 3.3.4 Neutron Diffraction; 3.3.4.1 The diffracted intensities; 3.3.4.2 Corrections of observables; 3.3.4.3 Sample specific corrections; 3.3.4.4 The neutron diffractometers; 3.3.4.5 Preparation of the sample; 3.3.4.6 Experiments at the D15 device for integrated neutrons; 3.3.4.7 Experiments at the D3 for spin-polarized neutrons; 4: The Extension of Pillar 3: The DEN Method; 4.1 The Principal Idea; 4.2 The Hardware Components; 4.3 Description of the Software.
505 8 $a4.3.1 The Commercial Software Frame IDL4.3.2 The Preparing Crystallographic Routine EVOX; 4.3.3 The Input of the Experimental and Calculated Structure Factors; 4.3.4 The Main Program DEDLOT and Its Mode of Operation; 4.3.5 The Routine to Identify Series Termination Errors; 5: Application of the DEN on a Representative Example; 5.1 Fe2SiO4: Description of Its Crystallographic and Magnetic Properties; 5.2 Derivation of the Experimental efg by SCMBS; 5.3 Calculation of the Full Quantitative efg by the DFT Method; 5.4 Establishing the Semi-Quantitative efg with the DEN.
504 $aIncludes bibliographical references and index.
588 0 $aOnline resource; title from PDF title page (EBSCO, viewed July 11, 2017).
520 $a"This book deals with the difference electron nanoscope (DEN), whose principles have been invented and realised by the book author. The DEN is based on a smart combination of diffractometric and spectroscopic data and uses a visualisation of three-dimensional difference electron densities (in our case stemming from 3d orbitals) in order to obtain the key quantity involved, the electric field gradient (efg). However, the DEN is no machine, as the title of the book might infer. It is a computer program running on a fast computer system displaying 3D difference electron hyperareas floating in space and the relevant efg as a wire frame model within the unit cell of the sample involved. In this sense, it acts on a sub-nanometer scale (hence the term "nanoscope") and generates images of uncompared symmetrical and physical evidence and beauty. For the first time, diffractometry and spectroscopy have been integrated for the common synergetic effects that may contribute to a better understanding of electric and magnetic interactions in a crystal. The experimental derivation of the common quantity, the efg, is not confined to iron-containing samples, as the use of Mössbauer spectroscopy might infer, but can also be determined by nuclear quadrupole resonance that is not confined to special nuclides. Hence, the DEN can be applied to a huge multitude of scientifically interesting specimens since the main method involved, diffractometry in a wide sense, has no general limitations at all. So it is a rather universal method, and the monograph might contribute to a wide distribution of the method in the scientific world. Has anyone seen a real orbital before: a real orbital distribution in a crystal unit cell together with its efg tensor ellipsoid? In this book, one can see it."--Provided by publisher.
650 0 $aElectron microscopes.
650 0 $aSpectrum analysis.
650 0 $aNanoelectronics.
650 6 $aMicroscopes électroniques.
650 6 $aNanoélectronique.
650 7 $aSCIENCE$xGeneral.$2bisacsh
650 7 $aElectron microscopes.$2fast$0(OCoLC)fst00906679
650 7 $aNanoelectronics.$2fast$0(OCoLC)fst01741867
650 7 $aSpectrum analysis.$2fast$0(OCoLC)fst01129108
655 0 $aElectronic books.
655 4 $aElectronic books.
776 08 $iPrint version:$aLottermoser, Werner.$tDifference electron nanoscope.$d[Singapore] : Pan Stanford Publishing ; Roca Raton, FL : CRC Press, Taylor & Francis Group, [2017]$z9814774014$z9789814774017$w(OCoLC)990588256
856 40 $uhttp://www.columbia.edu/cgi-bin/cul/resolve?clio15120454$zTaylor & Francis eBooks
852 8 $blweb$hEBOOKS