| Record ID | marc_columbia/Columbia-extract-20221130-031.mrc:81090437:4828 |
| Source | marc_columbia |
| Download Link | /show-records/marc_columbia/Columbia-extract-20221130-031.mrc:81090437:4828?format=raw |
LEADER: 04828cam a2200625 a 4500
001 15080730
005 20220709230722.0
006 m o d
007 cr |n|||||||||
008 100405s2011 flua ob 001 0 eng c
035 $a(OCoLC)ocn680017953
035 $a(NNC)15080730
040 $aCOO$beng$epn$cCOO$dN$T$dYDXCP$dEBLCP$dCUS$dOCLCQ$dMERUC$dOCLCQ$dOCLCA$dOCLCF$dOCLCQ$dIDEBK$dDEBSZ$dOCLCQ$dWY@$dUUM$dNLE$dIUL$dYDX$dTOF$dOCLCQ$dUKMGB$dWYU$dAU@$dUKAHL$dOCLCQ$dK6U$dOCLCO
015 $aGBB7L4691$2bnb
015 $aGBB012255$2bnb
016 7 $a015479214$2Uk
016 7 $a018587448$2Uk
019 $a670282621$a1065911826
020 $a9781439826942$q(hc ;$qalk. paper)
020 $a1439826943$q(hc ;$qalk. paper)
020 $a9781439826959$q(electronic bk.)
020 $a1439826951$q(electronic bk.)
035 $a(OCoLC)680017953$z(OCoLC)670282621$z(OCoLC)1065911826
037 $aTANDF_214168$bIngram Content Group
042 $apcc
050 4 $aTK7871.85$b.R317 2011
072 7 $aTEC$x008100$2bisacsh
072 7 $aTEC$x008090$2bisacsh
082 04 $a621.3815/2$222
049 $aZCUA
245 00 $aRadiation effects in semiconductors /$cedited by Krzysztof Iniewski.
260 $aBoca Raton :$bCRC Press,$c©2011.
300 $a1 online resource (xv, 415 pages) :$billustrations
336 $atext$btxt$2rdacontent
337 $acomputer$bc$2rdamedia
338 $aonline resource$bcr$2rdacarrier
490 1 $aDevices, circuits, and systems
504 $aIncludes bibliographical references and index.
505 0 $aRadiation damage in silicon / Gianluigi Casse -- Radiation-tolerant CMOS single-photon imagers for multiradiation detection / Edoardo Charbon [and others] -- Effects of hydrogen on the radiation response on field-oxide field-effect transistors and high-k dielectrics / Xing J. Zhou, Daniel M. Fleetwood, and Ronald D. Schrimpf -- Novel total dose and heavy-ion charge collection phenomena in a new SiGe HBT on thin-film SOI technology / Grégory Avenier [and others] -- Radiation-hard voltage and current references in standard CMOS technologies / Vladimir Gromov and Anne-Johan Annema -- Nanocrystal memories : an evolutionary approach to flash memory scaling and a class of radiation-tolerant devices / Cosimo Gerardi [and others] -- Radiation hardened by design SRAM strategies for TID and SEE mitigation / Lawrence T. Clark -- A complete guide to multiple upsets in SRAMs processed in decananometric CMOS technologies / Gilles Gasiot and Phillippe Roche -- Real-time soft error rate characterization of advanced SRAMs / Jean-Luc Autran [and others] -- Fault tolerance techniques and reliability modeling for SRAM-based FPGAs / Keith S. Morgan [and others] -- Assuring robust triple modular redundancy protected circuits in SRAM-based FPGAs / Michael Caffrey [and others] -- SEU/SET tolerant phase-locked loops / Robert L. Shuler, Jr. -- Autonomous detection and characterization of radiation-induced transients in semiconductor integrated circuits / Balaji Narasimham [and others] -- Soft errors in digital circuits : overview and protection techniques for digital filters / Pedro reviriego Vasallo and Juan Antonio Maestro -- Fault-injection techniques for dependability analysis : an overview / Massimo Violante.
520 $aThere is a need to understand and combat potential radiation damage problems in semiconductor devices and circuits. Written by international experts, this book explains the effects of radiation on semiconductor devices, radiation detectors, and electronic devices and components. These contributors explore emerging applications, detector technologies, circuit design techniques, new materials, and innovative system approaches. The text focuses on how the technology is being used rather than the mathematical foundations behind it. It covers CMOS radiation-tolerant circuit implementations, CMOS pr.
650 0 $aSemiconductors$xEffect of radiation on.
650 0 $aPhoton emission.
650 6 $aSemi-conducteurs$xEffets du rayonnement sur.
650 6 $aPhotons$xÉmission.
650 7 $aTECHNOLOGY & ENGINEERING$xElectronics$xSolid State.$2bisacsh
650 7 $aTECHNOLOGY & ENGINEERING$xElectronics$xSemiconductors.$2bisacsh
650 7 $aPhoton emission.$2fast$0(OCoLC)fst01062064
650 7 $aSemiconductors$xEffect of radiation on.$2fast$0(OCoLC)fst01112217
655 0 $aElectronic books.
655 4 $aElectronic books.
700 1 $aIniewski, Krzysztof,$d1960-
776 08 $iPrint version:$tRadiation effects in semiconductors.$dBoca Raton, FL : CRC Press, ©2011$z9781439826942$w(DLC) 2010011811$w(OCoLC)435419190
830 0 $aDevices, circuits, and systems.
856 40 $uhttp://www.columbia.edu/cgi-bin/cul/resolve?clio15080730$zTaylor & Francis eBooks
852 8 $blweb$hEBOOKS