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MARC Record from marc_columbia

Record ID marc_columbia/Columbia-extract-20221130-033.mrc:20681333:3192
Source marc_columbia
Download Link /show-records/marc_columbia/Columbia-extract-20221130-033.mrc:20681333:3192?format=raw

LEADER: 03192cam a2200505Mi 4500
001 16072327
005 20220611232830.0
006 m o d
007 cr |||||||||||
008 180813s1990 flub ob 001 0 eng d
035 $a(OCoLC)on1082194701
035 $a(NNC)16072327
040 $aTYFRS$beng$epn$cTYFRS$dOCLCO$dOCLCF$dUHL$dTYFRS$dOCLCQ$dOCLCO
020 $a9781420050653$q(e-book ;$qPDF)
020 $a1420050656
020 $a9780367806507$q(electronic bk.)
020 $a0367806509$q(electronic bk.)
035 $a(OCoLC)1082194701
037 $a9780367806507$bTaylor & Francis
050 4 $aTK7878.4$b.W55 1990
072 7 $aTEC$x008000$2bisacsh
072 7 $aSCI$x055000$2bisacsh
072 7 $aTJF$2bicssc
082 04 $a621.381/548$223
049 $aZCUA
100 1 $aWilmshurst, T. H.,$eauthor.
245 10 $aSignal recovery from noise in electronic instrumentation /$cby T.H Wilmshurst.
250 $aSecond edition.
264 1 $aBoca Raton, FL :$bCRC Press, an imprint of Taylor and Francis,$c1990.
300 $a1 online resource (246 pages)
336 $atext$btxt$2rdacontent
337 $acomputer$bc$2rdamedia
338 $aonline resource$bcr$2rdacarrier
505 0 $aChapter of the displayed signal -- chapter fiin (c) but the -- chapter ~ I ~ NOISE -- chapter ~ I ~ NOISET and are separated widely as shown, so -- l/f noise error in -- chapter ~ I ~ NOISE of subtracting two values separated in time by TJ2. Thus -- chapter 7 7 -- chapter ~ I ~ NOISE 145 -- chapter Tl seconds earlier. This actually maintains the running sum rather than the -- chapter ~ I ~ NOISE -- chapter a periodic -- chapter C and so avoids the.
520 3 $aCovering all aspects of the subject, Signal Recovery from Noise in Electronic Instrumentation, Second Edition examines the interference involved with instruments that employ electronic techniques to measure physical quantities, including random fluctuations from thermal or background sources and systematic signal drift or offset. In the case of random noise, the book fully analyzes 1/f as well as white noise. It also discusses the theory and practice of baseline correction, low-pass filtering, multiple time averaging, and phase-sensitive detection. The author explores the best way of measuring the amplitude or the time of occurrence of a signal of known shape. New to this edition are an additional chapter, frequency measurement, and tutorial questions with answers to test understanding of the subject matter. This book will be indispensable to advanced electronics undergraduates, nonspecialist postgraduates using electronic instrumentation, and applied scientists.
650 0 $aElectronic instruments$xNoise.
650 6 $aAppareils électroniques$xBruit.
650 7 $aSCIENCE$xPhysics.$2bisacsh
650 7 $aTECHNOLOGY$xElectronics$xGeneral.$2bisacsh
650 7 $aElectronic instruments$xNoise.$2fast$0(OCoLC)fst00907306
655 0 $aElectronic books.
655 4 $aElectronic books.
776 08 $iPrint version:$z9781138422421$w(DLC) 90042740
856 40 $uhttp://www.columbia.edu/cgi-bin/cul/resolve?clio16072327$zTaylor & Francis eBooks
852 8 $blweb$hEBOOKS