MARC Record from marc_columbia

LEADER: 05762cam a2200553Mi 4500
001 16637226
005 20220709224305.0
006 m eo d
007 cr bn||||m|||a
008 181219s2019 wau ob 001 0 eng d
035 $a(OCoLC)on1080248721
035 $a(NNC)16637226
040 $aSPIES$beng$erda$cSPIES$dOCLCO$dUIU$dOCLCF$dUAB$dCEF$dCUS$dUPM$dOCLCQ$dUWO$dOCLCO
020 $a9781510622944$q(pdf)
020 $a1510622942$q(pdf)
020 $z9781510622937$q(softcover ;$qalk. paper)
020 $z9781510622951$q(epub)
020 $z9781510622968$q(kindle/mobi)
024 7 $a10.1117/3.2513685$2doi
035 $a(OCoLC)1080248721
050 4 $aQC367$b.H37 2019eb
082 04 $a681/.25$223
049 $aZCUA
100 1 $aHarding, Kevin G.,$eauthor.
245 10 $aPractical optical dimensional metrology /$cKevin G. Harding.
264 1 $aBellingham, Washington (1000 20th St. Bellingham WA 98225-6705 USA) :$bSPIE,$c2019.
300 $a1 online resource (xii, 228 pages)
336 $atext$btxt$2rdacontent
337 $acomputer$bc$2rdamedia
338 $aonline resource$bcr$2rdacarrier
490 1 $aTutorial texts in optical engineering ;$vvolume TT 119
504 $aIncludes bibliographical references and index.
505 0 $aPreface -- 1. Introduction to metrology: 1.1. Basic terms; 1.2. Methods of optical metrology; References -- 2. Light-intensity-based metrology: 2.1. Light, optics, and machine vision technology; 2.2. Where to use intensity-based methods; 2.3. Sources of errors; References -- 3. Triangulation and shift-based metrology: 3.1. Stereo imaging; 3.2. Active triangulation; 3.3. 3D phase-based measurements; 3.4. Summary of triangulation and phase shift methods; References -- 4. Focus-based optical metrology: 4.1. Introduction to focus-based methods; 4.2. Point-based distance measurement; 4.3. Area-based focus metrology methods; 4.4. Focus-based metrology summary; References -- 5. Light-characteristic-based dimensional measurements: 5.1. Introduction to light characteristics; 5.2. Polarization-based dimensional metrology; 5.3. Light-scatter-based measurements; 5.4. Color-based measurements; References -- 6. Portable and hybrid gages: 6.1. Introduction to portable and hybrid gages; 6.2. Measurement of large structures; 6.3. Measurement of mid- to large-size durable assets; 6.4. High-precision hybrid systems; 6.5. Summary of hybrid gages; References -- 7. Finding the right technology for the application: 7.1. Introduction; 7.2. Low-precision applications,10 mm; 7.3. Large objects and assemblies,1 mm; 7.4. General manufacturing applications,0.1 mm; 7.5. Precision manufactured parts,0.01 mm; 7.6. Micro-feature metrology,0.001 mm; 7.7. Nano-features,0.0001 mm; 7.8. Summary of application comparisons
505 8 $a8. Part location: 8.1. Part location applications; 8.2. Large parts measured to,10-mm resolution; 8.3. Composite layup monitoring; 8.4. Part location summary of options; References -- 9. Optimized measurement of gaps: 9.1. The application,0.1 mm; 9.2. Elimination of methods that are not suitable; 9.3. Laser line triangulation; 9.4. 3D triangulation; 9.5. Chromatic confocal method; 9.6. Comparison tests; 9.7. Comparison of methods; 9.8. Summary of options; References -- 10. Measurement of small holes: 10.1. The application,0.01 mm; 10.2. Laser line structured light (static); 10.3. Scanning-laser-line or multiple-laser-line probe; 10.4. Phase-shifted structured light; 10.5. Conoscopic point probe; 10.6. Confocal point probe; 10.7. Digital optical comparator (2D); 10.8. Depth from focus microscopy; 10.9. Depth from defocus microscopy; 10.10. Summary of options; References -- 11. Three-dimensional metrology for printed electronics: 11.1. The application,0.001 mm; 11.2. Laser line structured light (static); 11.3. Phase-shifted structured light; 11.4. Confocal point probes; 11.5. Depth from focus or defocus microscopy; 11.6. Artifact-based verification; 11.7. Conclusions; References -- 12. Industrial surface finish method comparison for fine finish measurements: 12.1. The application,0.0001 mm; 12.2. Interferometry; 12.3. Focus-based systems; 12.4. Confocal systems; 12.5. Scatter-based systems; 12.6. Comparison of methods; 12.7. Summary of options; References -- Index.
520 $aPractical Optical Dimensional Metrology provides basic explanations of the operation and application of the most common methods in the field and in commercial use. The first half of the book presents a working knowledge of the mechanism and limitations of optical dimensional measurement methods that use: light level changes, two-dimensional imaging, triangulation, structured-light patterns, interference patterns, optical focus, light characteristics such as polarization, and hybrid methods with mechanical or other measurement tools. The book concludes with a series of manufacturing application examples that look at measurements from the centimeter range down to the nanometer range.
500 $aTitle from PDF title page (SPIE eBooks Website, viewed 2018-12-19).
650 0 $aOptical measurements.
650 0 $aMetrology.
650 6 $aMesures optiques.
650 6 $aMétrologie.
650 7 $aMetrology.$2fast$0(OCoLC)fst01018841
650 7 $aOptical measurements.$2fast$0(OCoLC)fst01046776
655 0 $aElectronic books.
655 4 $aElectronic books.
710 2 $aSociety of Photo-optical Instrumentation Engineers,$epublisher.
776 08 $iPrint version$z1510622934$z9781510622937$w(DLC) 2018039889
830 0 $aTutorial texts in optical engineering ;$vTT119.
856 40 $uhttp://www.columbia.edu/cgi-bin/cul/resolve?clio16637226$zACADEMIC - General Engineering & Project Administration
852 8 $blweb$hEBOOKS