| Record ID | marc_loc_2016/BooksAll.2016.part01.utf8:32401537:809 |
| Source | Library of Congress |
| Download Link | /show-records/marc_loc_2016/BooksAll.2016.part01.utf8:32401537:809?format=raw |
LEADER: 00809cam a22002534a 4500
001 00049275
003 DLC
005 20010620110046.0
008 000925s2001 gw a b 001 0 eng
010 $a 00049275
020 $a3540678417 (alk. paper)
040 $aDLC$cDLC$dDLC
042 $apcc
050 00 $aTA417.23$b.F85 2001
082 00 $a620.1/1299$221
100 1 $aFultz, B.$q(Brent)
245 10 $aTransmission electron microscopy and diffractometry of materials /$cBrent Fultz, James Howe.
260 $aBerlin ;$aNew York :$bSpringer,$c2001.
300 $axix, 748 p. :$bill. ;$c24 cm.
504 $aIncludes bibliographical references and index.
650 0 $aMaterials$xMicroscopy.
650 0 $aTransmission electron microscopy.
650 0 $aX-ray diffractometer.
700 1 $aHowe, James M.,$d1955-