Record ID | marc_loc_2016/BooksAll.2016.part01.utf8:46363904:976 |
Source | Library of Congress |
Download Link | /show-records/marc_loc_2016/BooksAll.2016.part01.utf8:46363904:976?format=raw |
LEADER: 00976cam a22002534a 4500
001 00065143
003 DLC
005 20030121073736.0
008 001108s2001 enka b 001 0 eng
010 $a 00065143
020 $a052179546X (paperback)
040 $aDLC$cDLC$dDLC
042 $apcc
050 00 $aQA76.76.T48$bW38 2001
082 00 $a005.1/4$221
100 1 $aWatkins, John$q(John Edward)
245 10 $aTesting IT :$ban off-the-shelf software testing process /$cJohn Watkins.
260 $aCambridge ;$aNew York :$bCambridge University Press,$c2001.
300 $axv, 315 p. :$bill. ;$c28 cm.
504 $aIncludes bibliographical references (p. 295-296) and index.
650 0 $aComputer software$xTesting.
856 41 $3Sample text$uhttp://www.loc.gov/catdir/samples/cam031/00065143.html
856 42 $3Publisher description$uhttp://www.loc.gov/catdir/description/cam021/00065143.html
856 41 $3Table of contents$uhttp://www.loc.gov/catdir/toc/cam022/00065143.html