| Record ID | marc_loc_2016/BooksAll.2016.part01.utf8:60512437:679 |
| Source | Library of Congress |
| Download Link | /show-records/marc_loc_2016/BooksAll.2016.part01.utf8:60512437:679?format=raw |
LEADER: 00679cam a2200229 a 4500
001 00265127
003 DLC
005 20000825112402.0
008 000203s1999 nyu 000 0 eng
010 $a 00265127
020 $a0471349844
040 $aDLC$cDLC$dDLC
050 00 $aTA165$b.T37 1999
082 00 $a681/.2$221
245 00 $aTest and measurement$ba definitive guide to sensor development and opportunities.
260 $aNew York :$bJohn Wiley,$cc1999.
300 $axiv, 173 p. :$bill. ;$c28 cm.
440 0 $aTechnical insights
650 0 $aEngineering instruments.
650 0 $aDetectors.
650 0 $aMeasuring instruments.
650 0 $aTesting$xEquipment and supplies.