| Record ID | marc_loc_2016/BooksAll.2016.part01.utf8:63442368:1486 |
| Source | Library of Congress |
| Download Link | /show-records/marc_loc_2016/BooksAll.2016.part01.utf8:63442368:1486?format=raw |
LEADER: 01486cam a22003377a 4500
001 00268728
003 DLC
005 20010228111134.0
008 000616s1999 wau b 101 0 eng d
010 $a 00268728
035 $a(OCoLC)ocm41646834
040 $aCUS$cCUS$dDLC
042 $alccopycat
020 $a0819430773
050 00 $aR856.A2$bP75 1999
245 10 $aProceedings of scanning and force microscopies for biomedical applications :$b24-25 January 1999, San Jose, California /$cEiichi Tamiya, Shuming Nie, chairs/editors ; sponsored by SPIE--the International Society for Optical Engineering [and] IBOS--International Biomedical Optics Society.
246 30 $aScanning and force microscopies for biomedical applications
260 $aBellingham, Wash., USA :$bSPIE,$cc1999.
300 $avii, 168 p. :$bill. (some col.) ;$c28 cm.
440 0 $aProgress in biomedical optics
490 1 $aSPIE proceedings series,$x0277-786X ;$vv. 3607
504 $aIncludes bibliographical references and index.
650 0 $aMedical electronics$vCongresses.
650 0 $aScanning probe microscopy$vCongresses.
650 0 $aScanning force microscopy$vCongresses.
650 0 $aNanotechnology$vCongresses.
700 1 $aTamiya, Eiichi.
700 1 $aNie, Shuming.
710 2 $aSociety of Photo-optical Instrumentation Engineers.
710 2 $aInternational Biomedical Optics Society.
830 0 $aProceedings of SPIE--the International Society for Optical Engineering ;$vv. 3607.