| Record ID | marc_loc_2016/BooksAll.2016.part02.utf8:136612646:1144 |
| Source | Library of Congress |
| Download Link | /show-records/marc_loc_2016/BooksAll.2016.part02.utf8:136612646:1144?format=raw |
LEADER: 01144cam a22002891 4500
001 16015638
003 DLC
005 20040929101310.0
008 750709s1916 mduac b 000 0 eng
010 $a 16015638
035 $a(OCoLC)1439377
040 $aDLC$cFJ$dNcRS$dDLC
041 1 $aeng$hfre
050 00 $aLB1131$b.B4
100 1 $aBinet, Alfred,$d1857-1911.
245 14 $aThe development of intelligence in children$b(the Binet-Simon scale)$cby Alfred Binet, SC. D., and Th. Simon, M. D., tr. by Elizabeth S. Kite.
260 $aBaltimore,$bWilliams & Wilkins company,$c1916.
300 $a336, [1] p.$billus., port.$c24 cm.
490 0 $aPublications of the Training school at Vineland, New Jersey, Department of research ...$vno. 11, May, 1916
500 $aTranslated from L'Annee psychologique, 1905, p. 163-336; 1908, p. 1-90; 1911, p. 145-201.
504 $aBibliography: p. [337]
650 0 $aPsychophysiology.
650 0 $aBinet-Simon Test.
650 0 $aChildren$xIntelligence testing.
650 0 $aPeople with mental disabilities.
700 1 $aSimon, Th.,$d1873-$ejoint author.
700 1 $aKite, Elizabeth S.,$d1864-$etr.