| Record ID | marc_loc_2016/BooksAll.2016.part08.utf8:120520260:808 |
| Source | Library of Congress |
| Download Link | /show-records/marc_loc_2016/BooksAll.2016.part08.utf8:120520260:808?format=raw |
LEADER: 00808cam a2200229 i 4500
001 74034162
003 DLC
005 20121124080711.0
008 750102s1975 nyua b 001 0 eng
010 $a 74034162
020 $a0306308207
040 $aDLC$cDLC$dDLC
050 00 $aQH212.S3$bG64
082 00 $a502/.8
100 1 $aGoldstein, Joseph,$d1939-
245 10 $aPractical scanning electron microscopy :$belectron and ion microprobe analysis /$cedited by Joseph I. Goldstein and Harvey Yakowitz ; foreword by T. E. Everhart.
260 $aNew York :$bPlenum Press,$c[1975]
300 $axviii, 582 p. :$bill. ;$c24 cm.
504 $aIncludes bibliographical references and index.
650 0 $aScanning electron microscopy.
650 0 $aMicroprobe analysis.
700 1 $aYakowitz, Harvey,$d1939-$ejoint author.