| Record ID | marc_loc_2016/BooksAll.2016.part12.utf8:27052377:776 |
| Source | Library of Congress |
| Download Link | /show-records/marc_loc_2016/BooksAll.2016.part12.utf8:27052377:776?format=raw |
LEADER: 00776cam a2200229 i 4500
001 79100716
003 DLC
005 19850711000000.0
008 790413s1978 nyu b f00010 eng
010 $a 79100716 //r85
020 $c$30.00
050 0 $aTK7874$b.R54
082 $a621.381/73/028
100 10 $aRickers, Henry C.
245 10 $aMicrocircuit screening effectiveness :$btechnical reliability study /$cprepared by Henry C. Rickers.
260 0 $aGriffiss Air Force Base, N.Y. :$bReliability Analysis Center,$c1978.
300 $ax, 104 p. :$bgraphs ;$c28 cm.
500 $a"Ordering number TRS-1."
504 $aBibliography: p. 95-99.
650 0 $aIntegrated circuits$xReliability.
650 0 $aIntegrated circuits$xTesting.
710 20 $aReliability Analysis Center (U.S.)