| Record ID | marc_loc_2016/BooksAll.2016.part13.utf8:53819642:685 |
| Source | Library of Congress |
| Download Link | /show-records/marc_loc_2016/BooksAll.2016.part13.utf8:53819642:685?format=raw |
LEADER: 00685cam a2200229 i 4500
001 80501482
003 DLC
005 19840313000000.0
008 801016m19809999enka 00110 eng
010 $a 80501482 //r84
015 $aGB***
020 $a0905927354 (pbk. : v. 1) :$c£8.50
050 0 $aQH212.E4$bC47 1980
082 0 $a502/.8/25$219
100 10 $aChapman, S. K.$q(Steve K.)
245 10 $aUnderstanding & optimising electron microscope performance /$cS. K. Chapman.
250 $aRev. 2d ed.
260 0 $aLondon :$bScience Reviews,$c1980-
300 $av. :$bill. ;$c22 cm.
500 $aIncludes index.
505 1 $a1. Transmission microscopy.
650 0 $aElectron microscopy.