| Record ID | marc_loc_2016/BooksAll.2016.part14.utf8:176835311:676 |
| Source | Library of Congress |
| Download Link | /show-records/marc_loc_2016/BooksAll.2016.part14.utf8:176835311:676?format=raw |
LEADER: 00676pam a2200217 a 4500
001 83011768
003 DLC
005 19850227000000.0
008 830622s1984 enka b 00110 eng
010 $a 83011768
020 $a0201144034
050 0 $aTK7868.L6$bB45 1984
082 0 $a621.3819/535$219
100 10 $aBennetts, R. G.
245 10 $aDesign of testable logic circuits /$cR.G. Bennetts.
260 0 $aLondon ;$aReading, Mass. :$bAddison-Wesley Pub. Co.,$cc1984.
300 $axii, 164 p. :$bill. ;$c25 cm.
440 0 $aMicroelectronics systems design series
504 $aIncludes bibliographies and index.
650 0 $aLogic circuits.
650 0 $aLogic circuits$xTesting.