| Record ID | marc_loc_2016/BooksAll.2016.part14.utf8:47065595:1186 |
| Source | Library of Congress |
| Download Link | /show-records/marc_loc_2016/BooksAll.2016.part14.utf8:47065595:1186?format=raw |
LEADER: 01186cam a2200241 a 4500
001 82061899
003 DLC
005 19880615000000.0
008 830926s1982 waua b i10100 eng
010 $a 82061899 //r882
020 $a0892523840 (pbk.)
050 0 $aTA1540$b.I53 1982
082 0 $a620.1/127$219
245 00 $aIndustrial applications of holographic nondestructive testing :$bMay 3-5, 1982, Brussels /$cJ. Ebbeni, chairman/editor ; sponsored by SPIE--the International Society for Optical Engineering ; with the support of Association belge pour l'étude, l'essai et l'emploi des matériaux (ABEM) ... [et al.].
260 0 $aBellingham, Wash. :$bSPIE--the International Society for Optical Engineering,$c1982.
300 $avi, 199 p. :$bill. ;$c28 cm.
490 1 $aProceedings / SPIE ;$vv. 349
504 $aIncludes bibliographical references and indexes.
650 0 $aHolographic testing$xCongresses.
700 10 $aEbbeni, J.
710 20 $aSociety of Photo-optical Instrumentation Engineers.
710 20 $aAssociation belge pour l'étude, l'essai et l'emploi des matériaux.
830 0 $aProceedings of SPIE--the International Society for Optical Engineering ;$vv. 349.