| Record ID | marc_loc_2016/BooksAll.2016.part16.utf8:79472326:1027 |
| Source | Library of Congress |
| Download Link | /show-records/marc_loc_2016/BooksAll.2016.part16.utf8:79472326:1027?format=raw |
LEADER: 01027cam a2200265 a 4500
001 85005061
003 DLC
005 19860107000000.0
008 850306s1985 paua b 10100 eng
010 $a 85005061
020 $a0091837065
050 0 $aQD921$b.A27 1985
082 0 $a620.1/127$219
245 00 $aAdvanced photon and particle techniques for the characterization of defects in solids :$bsymposium held November 27-29, 1984, Boston, Massachusetts, U.S.A. /$ceditors, J.B. Roberto, R.W. Carpenter, M.C. Wittels.
260 0 $aPittsburgh, Pa. :$bMaterials Research Society,$cc1985.
300 $axi, 390 p. :$bill. ;$c24 cm.
440 0 $aMaterials Research Society symposia proceedings,$x0272-9172 ;$vv. 41
504 $aIncludes bibliographies and indexes.
650 0 $aCrystals$xDefects$xCongresses.
650 0 $aElectron microscopy$xCongresses.
650 0 $aProton beams$xCongresses.
650 0 $aParticle beams$xCongresses.
700 10 $aRoberto, J. B.
700 10 $aCarpenter, R. W.
700 10 $aWittels, M. C.