| Record ID | marc_loc_2016/BooksAll.2016.part16.utf8:85682479:752 |
| Source | Library of Congress |
| Download Link | /show-records/marc_loc_2016/BooksAll.2016.part16.utf8:85682479:752?format=raw |
LEADER: 00752cam a2200229 a 4500
001 85012627
003 DLC
005 20111221091100.0
008 850529s1985 gw a b 001 0 eng
010 $a 85012627
020 $a0387135308 (U.S.)
040 $aDLC$cDLC$dDLC
050 00 $aQH212.S3$bR452 1985
082 00 $a535/.3325$219
100 1 $aReimer, Ludwig,$d1928-
245 10 $aScanning electron microscopy :$bphysics of image formation and microanalysis /$cLudwig Reimer.
260 $aBerlin ;$aNew York :$bSpringer-Verlag,$cc1985.
300 $axviii, 457 p. :$bill. ;$c24 cm.
440 0 $aSpringer series in optical sciences ;$vv. 45
504 $aBibliography: p. [405]-446.
500 $aIncludes index.
650 0 $aScanning electron microscopy.