| Record ID | marc_loc_2016/BooksAll.2016.part16.utf8:98045967:844 |
| Source | Library of Congress |
| Download Link | /show-records/marc_loc_2016/BooksAll.2016.part16.utf8:98045967:844?format=raw |
LEADER: 00844cam a2200265 a 4500
001 85028261
003 DLC
005 19920619084611.3
008 851115s1986 nyua b 001 0 eng c
010 $a 85028261 //r92
020 $a0306421402
040 $aDNLM/DLC$cDLC$dDLC
050 00 $aQH212.S3$bA38 1986
060 $aQH 212.S3 A244
082 00 $a502/.8/25$219
245 00 $aAdvanced scanning electron microscopy and X-ray microanalysis /$cDale E. Newbury ... [et al.].
260 0 $aNew York :$bPlenum Press,$cc1986.
300 $axii, 454 p. :$bill. (some col.) ;$c24 cm.
504 $aBibliography: p. 435-448.
500 $aIncludes index.
650 0 $aScanning electron microscopy.
650 0 $aX-ray microanalysis.
650 2 $aElectron Probe Microanalysis.
650 2 $aMicroscopy, Electron, Scanning.
700 10 $aNewbury, Dale E.