| Record ID | marc_loc_2016/BooksAll.2016.part19.utf8:124666737:724 |
| Source | Library of Congress |
| Download Link | /show-records/marc_loc_2016/BooksAll.2016.part19.utf8:124666737:724?format=raw |
LEADER: 00724cam a2200229 a 4500
001 89070945
003 DLC
005 19920814132659.9
008 891122s1990 nyua b 00110 eng
010 $a 89070945 //r92
020 $a0306434105
040 $aDLC$cDLC$dDLC
050 00 $aTA1632$b.R87 1990
082 00 $a502/.8/20285$220
100 10 $aRuss, John C.
245 10 $aComputer-assisted microscopy :$bthe measurement and analysis of images /$cJohn C. Russ.
260 0 $aNew York :$bPlenum Press,$cc1990.
300 $axii, 453 p. :$bill. ;$c26 cm.
504 $aIncludes bibliographical references and index.
650 0 $aImage processing.
650 0 $aMicroscopy$xData processing.
650 0 $aOptical pattern recognition.